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Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.

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Title: Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.
Authors: Inagaki, Makoto1 (AUTHOR) inagaki.makoto.2r@kyoto-u.ac.jp, Ninomiya, Kazuhiko2 (AUTHOR), Yoshida, Go3 (AUTHOR), Kubo, Michael Kenya4 (AUTHOR), Yakushi, Kosei2 (AUTHOR), Watanabe, Eisuke3 (AUTHOR), Nakada, Hiroki1 (AUTHOR), Umegaki, Izumi5 (AUTHOR)
Source: Journal of Radioanalytical & Nuclear Chemistry. Jan2026, Vol. 335 Issue 1, p617-623. 7p.
Subjects: Elemental analysis, Gamma rays, Particle beams, Germanium detectors, Light elements, Raw materials, Trace elements
Abstract: A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Radioanalytical & Nuclear Chemistry is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 191694466
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.
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  Data: <searchLink fieldCode="AR" term="%22Inagaki%2C+Makoto%22">Inagaki, Makoto</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> inagaki.makoto.2r@kyoto-u.ac.jp</i><br /><searchLink fieldCode="AR" term="%22Ninomiya%2C+Kazuhiko%22">Ninomiya, Kazuhiko</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yoshida%2C+Go%22">Yoshida, Go</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kubo%2C+Michael+Kenya%22">Kubo, Michael Kenya</searchLink><relatesTo>4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yakushi%2C+Kosei%22">Yakushi, Kosei</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Watanabe%2C+Eisuke%22">Watanabe, Eisuke</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Nakada%2C+Hiroki%22">Nakada, Hiroki</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Umegaki%2C+Izumi%22">Umegaki, Izumi</searchLink><relatesTo>5</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Radioanalytical+%26+Nuclear+Chemistry%22">Journal of Radioanalytical & Nuclear Chemistry</searchLink>. Jan2026, Vol. 335 Issue 1, p617-623. 7p.
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  Data: <searchLink fieldCode="DE" term="%22Elemental+analysis%22">Elemental analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Gamma+rays%22">Gamma rays</searchLink><br /><searchLink fieldCode="DE" term="%22Particle+beams%22">Particle beams</searchLink><br /><searchLink fieldCode="DE" term="%22Germanium+detectors%22">Germanium detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Light+elements%22">Light elements</searchLink><br /><searchLink fieldCode="DE" term="%22Raw+materials%22">Raw materials</searchLink><br /><searchLink fieldCode="DE" term="%22Trace+elements%22">Trace elements</searchLink>
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  Label: Abstract
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  Data: A new non-destructive elemental analysis method using muon-induced gamma-rays was developed to quantify sub-percent components in bulk materials, including light elements. Pulsed muon beam irradiation experiments for iron reference samples containing varying silicon concentrations were conducted to demonstrate the method. Characteristic muonic X-rays and gamma-rays emitted from unstable nuclides generated by muon nuclear absorption were measured using germanium detectors during the beam irradiation. By measuring gamma-rays derived from silicon, we successfully quantified the silicon at a concentration of 0.36 wt.% in the bulk iron sample, which is difficult to detect using conventional muon elemental analysis based solely on X-rays. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of Journal of Radioanalytical & Nuclear Chemistry is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s10967-025-10668-0
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      – Code: eng
        Text: English
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        PageCount: 7
        StartPage: 617
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      – SubjectFull: Elemental analysis
        Type: general
      – SubjectFull: Gamma rays
        Type: general
      – SubjectFull: Particle beams
        Type: general
      – SubjectFull: Germanium detectors
        Type: general
      – SubjectFull: Light elements
        Type: general
      – SubjectFull: Raw materials
        Type: general
      – SubjectFull: Trace elements
        Type: general
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      – TitleFull: Development of a non-destructive elemental analysis method for sub-percent components using muon-induced gamma-rays.
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            – D: 01
              M: 01
              Text: Jan2026
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              Y: 2026
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