Fractal Dimension Analysis of Crystalline Formation Regions in Polyvinyl Alcohol/Zinc Oxide Nanocomposites with High Dielectric Constant.
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| Title: | Fractal Dimension Analysis of Crystalline Formation Regions in Polyvinyl Alcohol/Zinc Oxide Nanocomposites with High Dielectric Constant. |
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| Authors: | Nayana Nirmal, Susi1 (AUTHOR), Sajeev, Damodarakurup2 (AUTHOR) sajeevphy@gmail.com, Abhinav, Mohan3 (AUTHOR), Jijimon Kombukkattu, Thomas1 (AUTHOR), Rajesh, Surendran1 (AUTHOR) rajesh.s@mic.ac.in |
| Source: | Journal of Macromolecular Science: Physics. 2026, Vol. 65 Issue 4, p640-655. 16p. |
| Subjects: | Fractal dimensions, Polyvinyl alcohol, Crystal structure, Nanocomposite materials, Atomic force microscopy, Image analysis, Permittivity |
| Abstract: | Atomic Force Microscopy (AFM) images contain information regarding the variations in atomic and molecular forces from a few atomic layers beneath the surface of the materials in the image. Hence, an image analysis of the AFM images will help to unravel the relationship between the spatial distribution of material formations in composites and their anomalous dielectric constant. In our research described here, we examined the observed changes in the dielectric constant of polyvinyl alcohol/zinc oxide (PVA/ZnO) nanocomposites described with respect to their ZnO filler concentration using the fractal and atomic cluster analysis of the AFM images. We report a high dielectric constant of 330 at 9 wt% ZnO (90.8 ± 8 nm) filled PVA nanocomposites in the 1 MHz frequency region. Using image binarization techniques, we extracted the atomic level distribution of the crystalline material formations in the PVA/ZnO nanocomposites at filler concentrations from below to above the optimal weight percentage of 9 wt%. Our statistical distribution and fractal dimension analysis of these crystalline formation regions showed maximum correlations with the observed anomalous dielectric constant of composite material at an optimum (9 wt%) filler content. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | Atomic Force Microscopy (AFM) images contain information regarding the variations in atomic and molecular forces from a few atomic layers beneath the surface of the materials in the image. Hence, an image analysis of the AFM images will help to unravel the relationship between the spatial distribution of material formations in composites and their anomalous dielectric constant. In our research described here, we examined the observed changes in the dielectric constant of polyvinyl alcohol/zinc oxide (PVA/ZnO) nanocomposites described with respect to their ZnO filler concentration using the fractal and atomic cluster analysis of the AFM images. We report a high dielectric constant of 330 at 9 wt% ZnO (90.8 ± 8 nm) filled PVA nanocomposites in the 1 MHz frequency region. Using image binarization techniques, we extracted the atomic level distribution of the crystalline material formations in the PVA/ZnO nanocomposites at filler concentrations from below to above the optimal weight percentage of 9 wt%. Our statistical distribution and fractal dimension analysis of these crystalline formation regions showed maximum correlations with the observed anomalous dielectric constant of composite material at an optimum (9 wt%) filler content. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 00222348 |
| DOI: | 10.1080/00222348.2024.2445433 |
