Bibliographic Details
| Title: |
Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation |
| Authors: |
Müller-Buschbaum, P.1 muellerb@physik.tu-muenchen.de, Roth, S.V.2, Burghammer, M.2, Bauer, E.1, Pfister, S.1, David, C.3, Riekel, C.2 |
| Source: |
Physica B. Feb2005, Vol. 357 Issue 1/2, p148-151. 4p. |
| Subjects: |
Thin films, Aromatic compounds, Phenols, X-ray scattering, Thickness measurement |
| Abstract: |
Abstract: Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of the local micrometer sized defect structure is resolved. [Copyright &y& Elsevier] |
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| Database: |
Engineering Source |
