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Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation

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Title: Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation
Authors: Müller-Buschbaum, P.1 muellerb@physik.tu-muenchen.de, Roth, S.V.2, Burghammer, M.2, Bauer, E.1, Pfister, S.1, David, C.3, Riekel, C.2
Source: Physica B. Feb2005, Vol. 357 Issue 1/2, p148-151. 4p.
Subjects: Thin films, Aromatic compounds, Phenols, X-ray scattering, Thickness measurement
Abstract: Abstract: Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of the local micrometer sized defect structure is resolved. [Copyright &y& Elsevier]
Copyright of Physica B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
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Header DbId: egs
DbLabel: Engineering Source
An: 19181234
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation
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  Data: <searchLink fieldCode="AR" term="%22Müller-Buschbaum%2C+P%2E%22">Müller-Buschbaum, P.</searchLink><relatesTo>1</relatesTo><i> muellerb@physik.tu-muenchen.de</i><br /><searchLink fieldCode="AR" term="%22Roth%2C+S%2EV%2E%22">Roth, S.V.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Burghammer%2C+M%2E%22">Burghammer, M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Bauer%2C+E%2E%22">Bauer, E.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Pfister%2C+S%2E%22">Pfister, S.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22David%2C+C%2E%22">David, C.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Riekel%2C+C%2E%22">Riekel, C.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Physica+B%22">Physica B</searchLink>. Feb2005, Vol. 357 Issue 1/2, p148-151. 4p.
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  Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Aromatic+compounds%22">Aromatic compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Phenols%22">Phenols</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+scattering%22">X-ray scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Thickness+measurement%22">Thickness measurement</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: Abstract: Micro-cracks induced by evaporation-assisted flow of a polymeric blend solution are investigated. After evaporation of the solvent toluene, the blend film of polystyrene and poly-n-buthylacrylate exhibits small cracks aligned perpendicular to the original flow direction. The local defect in the elsewhere rather continuous blend film is probed with atomic force microscopy. With scanning sub-microbeam grazing incidence small angle X-ray scattering a position sensitive surface scattering experiment is presented. Due to the beam diameter of the local micrometer sized defect structure is resolved. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
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  Data: <i>Copyright of Physica B is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1016/j.physb.2004.11.045
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        Text: English
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        Type: general
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      – SubjectFull: Phenols
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      – SubjectFull: X-ray scattering
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      – SubjectFull: Thickness measurement
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      – TitleFull: Local defects in thin polymer films: a scanning sub-microbeam grazing incidence small angle scattering investigation
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              Text: Feb2005
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