Bibliographic Details
| Title: |
Why the Future of High-Power Test Benches Must Be Fully Integrated and Automated. |
| Authors: |
Pivit, Florian1, Saied, Jaafar2 |
| Source: |
Microwave Journal. Mar2026, Vol. 69 Issue 3, p20-30. 6p. |
| Subjects: |
Automation, Test systems, Testing equipment, Weapons testing, Electric testing, Computer software testing |
| Abstract: |
The article focuses on the accelerating growth and transformation of the test and measurement (T&M) industry to meet the demands of today's digitally-driven global economy. Topics include the expanding market across sectors like aerospace, defense, and energy, the critical need for reliable and scalable testing, and the shift from hardware-centric test benches to software-defined, automated, and integrated testing platforms. |
| Database: |
Engineering Source |