Why the Future of High-Power Test Benches Must Be Fully Integrated and Automated.
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| Title: | Why the Future of High-Power Test Benches Must Be Fully Integrated and Automated. |
|---|---|
| Authors: | Pivit, Florian1, Saied, Jaafar2 |
| Source: | Microwave Journal. Mar2026, Vol. 69 Issue 3, p20-30. 6p. |
| Subjects: | Automation, Test systems, Testing equipment, Weapons testing, Electric testing, Computer software testing |
| Abstract: | The article focuses on the accelerating growth and transformation of the test and measurement (T&M) industry to meet the demands of today's digitally-driven global economy. Topics include the expanding market across sectors like aerospace, defense, and energy, the critical need for reliable and scalable testing, and the shift from hardware-centric test benches to software-defined, automated, and integrated testing platforms. |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 192327633 AccessLevel: 6 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Why the Future of High-Power Test Benches Must Be Fully Integrated and Automated. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Pivit%2C+Florian%22">Pivit, Florian</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Saied%2C+Jaafar%22">Saied, Jaafar</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microwave+Journal%22">Microwave Journal</searchLink>. Mar2026, Vol. 69 Issue 3, p20-30. 6p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Automation%22">Automation</searchLink><br /><searchLink fieldCode="DE" term="%22Test+systems%22">Test systems</searchLink><br /><searchLink fieldCode="DE" term="%22Testing+equipment%22">Testing equipment</searchLink><br /><searchLink fieldCode="DE" term="%22Weapons+testing%22">Weapons testing</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+testing%22">Electric testing</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+software+testing%22">Computer software testing</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The article focuses on the accelerating growth and transformation of the test and measurement (T&M) industry to meet the demands of today's digitally-driven global economy. Topics include the expanding market across sectors like aerospace, defense, and energy, the critical need for reliable and scalable testing, and the shift from hardware-centric test benches to software-defined, automated, and integrated testing platforms. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=192327633 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 20 Subjects: – SubjectFull: Automation Type: general – SubjectFull: Test systems Type: general – SubjectFull: Testing equipment Type: general – SubjectFull: Weapons testing Type: general – SubjectFull: Electric testing Type: general – SubjectFull: Computer software testing Type: general Titles: – TitleFull: Why the Future of High-Power Test Benches Must Be Fully Integrated and Automated. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Pivit, Florian – PersonEntity: Name: NameFull: Saied, Jaafar IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 03 Text: Mar2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 01926225 Numbering: – Type: volume Value: 69 – Type: issue Value: 3 Titles: – TitleFull: Microwave Journal Type: main |
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