Bibliographic Details
| Title: |
Stubborn State Observers for Incrementally Quadratic Descriptor Systems Subject to Measurement Outliers. |
| Authors: |
Liu, Leipo1 (AUTHOR) liuleipo123@163.com, Wen, Qiaofeng2 (AUTHOR) qfwen1209@163.com, Li, Yanan3 (AUTHOR) liyn@hpu.edu.cn, Fu, Dexin1 (AUTHOR) zsclyfdx668@163.com, Cai, Xiushan4 (AUTHOR) xiushan@zjnu.cn |
| Source: |
Circuits, Systems & Signal Processing. Feb2026, Vol. 45 Issue 2, p911-937. 27p. |
| Subjects: |
Descriptor systems, Outliers (Statistics), Lyapunov functions, Exponential stability, Observability (Control theory), Linear matrix inequalities |
| Abstract: |
This study aims to deal with the problem of designing stubborn state observers for a class of nonlinear descriptor systems subject to possible external disturbances and unexpected measurement outliers. Nonlinear terms, in particular, meet the condition of incremental quadratic constraints that can describe a wide range of nonlinearities. A stubborn state observer is developed by injecting saturated output error with an adaptive saturation level to effectively attenuate the adverse impact of measurement outliers. Then, an appropriate Lyapunov function is established, and some sufficient conditions expressed by linear matrix inequalities are obtained to ensure that the estimation error system can achieve exponential admissibility with the performance requirement. Finally, the availability of the proposed observer is validated using two practical examples. [ABSTRACT FROM AUTHOR] |
|
Copyright of Circuits, Systems & Signal Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |