Bibliographic Details
| Title: |
Electrochemically deposited SnO2–TiO2 compact layers for enhanced carrier transport and defect passivation in dye-sensitized solar cells. |
| Authors: |
Ho, Ying-Rong1 (AUTHOR), Chen, Chao-Nan1 (AUTHOR), Chen, Jian-Zhi2 (AUTHOR), Huang, Jung-Jie1 (AUTHOR) jjhuang@asia.edu.tw |
| Source: |
Materials Science & Engineering: B. Jun2026, Vol. 328, pN.PAG-N.PAG. 1p. |
| Subjects: |
Dye-sensitized solar cells, Electron transport, Surface passivation, Charge carrier lifetime, Thin film deposition, Photovoltaic power generation |
| Abstract: |
This study presents the fabrication of SnO 2 –TiO 2 compact layers (CLs) by electrochemical deposition (ECD) to enhance the photovoltaic performance of dye-sensitized solar cells (DSSCs). Incorporating Sn into TiO₂ CLs significantly improved carrier transport and effectively passivated intrinsic TiO₂ defects. X-ray photoelectron spectroscopy revealed that SnO₂ doping suppressed Ti3+/Ti2+ states and increased the proportion of stable Ti4+, while high-resolution TEM confirmed the conformal growth of uniform composite films. The optimized SnO₂–TiO₂ CL reduced charge transport time from 16.46 ms to 3.45 ms, extended electron lifetime as verified by open-circuit voltage decay analysis, and improved device efficiency from 4.19% to 6.13%. Electrochemical impedance spectroscopy further demonstrated reduced interfacial resistance and enhanced electron collection. These results indicate that ECD-fabricated SnO₂–TiO₂ CLs simultaneously offer high conductivity and defect passivation, providing a cost-effective and scalable strategy for advancing DSSC performance and other optoelectronic semiconductor devices. • SnO 2 –TiO 2 compact layer by electrochemical deposition for DSSC device • SnO₂–TiO₂ layer can improved charge transport time and electron lifetime of device • The device efficiency improved from 4.19% to 6.13% after added SnO₂–TiO₂ layer • Electrochemically deposited SnO 2 –TiO 2 is suitable for improving the DSSC performance. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |