Observation of multiply ionized plasmas with dominant bound electron contribution to the index of refraction

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Bibliographic Details
Title: Observation of multiply ionized plasmas with dominant bound electron contribution to the index of refraction
Authors: Filevich, J.1 rage@engr.colostate.edu, Rocca, J.J.1, Marconi, M.C.1, Moon, S.J.2, Nilsen, J.2, Scofield, J.H.2, Dunn, J.2, Smith, R.F.2, Keenan, R.2, Hunter, J.R.2, Shlyaptsev, V.N.3
Source: Journal of Quantitative Spectroscopy & Radiative Transfer. May2006, Vol. 99 Issue 1-3, p165-174. 10p.
Subjects: Plasma gases, Optical measurements, Cathode rays, Properties of matter
Abstract: Abstract: We report anomalous fringe shifts observed in soft X-ray laser interferograms of laser-created Al plasmas. This clear experimental evidence shows that the contribution of bound electrons can dominate the index of refraction of laser-created plasmas at soft X-ray wavelengths, resulting in values greater than 1. The comparison of measured and simulated interferograms shows that this results from the dominant contribution of low-charge ions to the index of refraction. This usually neglected bound electron contribution can affect the propagation of soft X-ray radiation in plasmas and the interferometric diagnostics of plasmas for many elements. [Copyright &y& Elsevier]
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Database: Engineering Source
Description
Abstract:Abstract: We report anomalous fringe shifts observed in soft X-ray laser interferograms of laser-created Al plasmas. This clear experimental evidence shows that the contribution of bound electrons can dominate the index of refraction of laser-created plasmas at soft X-ray wavelengths, resulting in values greater than 1. The comparison of measured and simulated interferograms shows that this results from the dominant contribution of low-charge ions to the index of refraction. This usually neglected bound electron contribution can affect the propagation of soft X-ray radiation in plasmas and the interferometric diagnostics of plasmas for many elements. [Copyright &y& Elsevier]
ISSN:00224073
DOI:10.1016/j.jqsrt.2005.05.013