A robotic goniometer exchanger for high‐throughput single‐crystal X‐ray diffraction at SPring‐8.
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| Title: | A robotic goniometer exchanger for high‐throughput single‐crystal X‐ray diffraction at SPring‐8. |
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| Authors: | Nakamura, Yuiga1 (AUTHOR) ynakamura@spring8.or.jp, Maity, Sumit Ranjan1 (AUTHOR), Sasaki, Toshiyuki1 (AUTHOR), Ichiyanagi, Kouhei1 (AUTHOR) |
| Source: | Journal of Synchrotron Radiation. May2026, Vol. 33 Issue 3, p825-828. 4p. |
| Subjects: | Goniometers, Diffractometers, X-ray diffraction, X-rays, X-ray crystallography, Industrial robots, Synchrotrons |
| Abstract: | Rapid and reliable sample handling is essential for high‐throughput single‐crystal diffraction at modern synchrotron facilities. At the high‐energy single‐crystal X‐ray diffraction beamline BL02B1 of SPring‐8, a compact six‐axis robotic arm was implemented as a diffractometer for single‐crystal measurements using high‐energy X‐rays. Coordinated six‐axis motion enables virtual rotation about an arbitrary axis and reproduction of a conventional ω‐scan geometry without additional rotary stages. Under identical beam conditions (180 µm × 113 µm), the robotic‐arm system yielded diffraction data with an internal agreement factor of Rint = 0.117, comparable with that obtained using a conventional goniometer (Rint = 0.134). Optical microscopy and diffraction analysis indicate a positional deviation of approximately ±17 µm during ω‐scans, with a standard deviation of the spindle position of 0.14°. Although this accuracy is lower than that of high‐precision single‐crystal goniometers, it is sufficient for diffraction experiments employing large beam sizes and high‐energy X‐rays. Owing to its compact design, programmable motion control and open geometry, the system provides a flexible platform for automated sample handling and high‐throughput diffraction experiments in support of the SPring‐8‐II upgrade. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | Rapid and reliable sample handling is essential for high‐throughput single‐crystal diffraction at modern synchrotron facilities. At the high‐energy single‐crystal X‐ray diffraction beamline BL02B1 of SPring‐8, a compact six‐axis robotic arm was implemented as a diffractometer for single‐crystal measurements using high‐energy X‐rays. Coordinated six‐axis motion enables virtual rotation about an arbitrary axis and reproduction of a conventional ω‐scan geometry without additional rotary stages. Under identical beam conditions (180 µm × 113 µm), the robotic‐arm system yielded diffraction data with an internal agreement factor of Rint = 0.117, comparable with that obtained using a conventional goniometer (Rint = 0.134). Optical microscopy and diffraction analysis indicate a positional deviation of approximately ±17 µm during ω‐scans, with a standard deviation of the spindle position of 0.14°. Although this accuracy is lower than that of high‐precision single‐crystal goniometers, it is sufficient for diffraction experiments employing large beam sizes and high‐energy X‐rays. Owing to its compact design, programmable motion control and open geometry, the system provides a flexible platform for automated sample handling and high‐throughput diffraction experiments in support of the SPring‐8‐II upgrade. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 09090495 |
| DOI: | 10.1107/S1600577526002110 |
