Kachare, O. R. (2026). FROM SYSTEM ZAP TO SILICON IMPROVEMENT: ADVANCED FAULT ISOLATION OF USB2 ELECTROSTATIC DISCHARGE FAILURES. Electronic Device Failure Analysis, 28(2), 32.
Chicago Style (17th ed.) CitationKachare, Omkar Rajesh. "FROM SYSTEM ZAP TO SILICON IMPROVEMENT: ADVANCED FAULT ISOLATION OF USB2 ELECTROSTATIC DISCHARGE FAILURES." Electronic Device Failure Analysis 28, no. 2 (2026): 32.
MLA (9th ed.) CitationKachare, Omkar Rajesh. "FROM SYSTEM ZAP TO SILICON IMPROVEMENT: ADVANCED FAULT ISOLATION OF USB2 ELECTROSTATIC DISCHARGE FAILURES." Electronic Device Failure Analysis, vol. 28, no. 2, 2026, p. 32.
Warning: These citations may not always be 100% accurate.