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Implementation of depth‐resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility.

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Title: Implementation of depth‐resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility.
Authors: Wang, You-Kang1,2 (AUTHOR), Yang, Yi-Ming1 (AUTHOR) yangym@ihep.ac.cn, Li, Run-Guang3 (AUTHOR), Yu, Dong-Hai3 (AUTHOR), Wang, Si-Sheng4 (AUTHOR), Wang, Zhi-Jun4 (AUTHOR), Liu, Peng1,5 (AUTHOR), Wang, Yan-Dong3 (AUTHOR) ydwang@ustb.edu.cn
Source: Journal of Applied Crystallography. Jun2026, Vol. 59 Issue 3, p923-931. 9p.
Subjects: Depth profiling, Synchrotrons, X-ray diffraction, Solids, Crystallography, Elastic deformation
Geographic Terms: China
Abstract: White‐beam X‐ray microdiffraction is a non‐destructive technique for probing microstructure and micromechanical behavior on the mesoscopic scale. Making use of the high throughput of Laue diffraction and advanced X‐ray focusing optics, this technique enables efficient point‐by‐point mapping of local crystal structure, lattice rotation and elastic strain with submicrometre spatial resolution. However, the deep penetration of X‐rays leads to a signal averaging effect along the beam path in bulk materials, which severely restricts further application of conventional microdiffraction. Herein, we report the successful implementation of differential aperture X‐ray microscopy on the standard Laue microdiffraction beamline (BL03HB) at the Shanghai Synchrotron Radiation Facility, China. Using a step‐scanned absorbing wire as a depth profiler for diffracted beams, the beamline is endowed with depth‐resolved analytical capability. We have also developed an efficient geometric parameter calibration method and screened a robust optimization algorithm for diffraction signal depth reconstruction via forward simulations. This implementation enabled the acquisition of depth‐resolved crystallographic information from a bulk silicon bimorph and a nickel‐based single‐crystal superalloy, with a depth resolution of <10 µm. These results lay a solid foundation for expanding the beamline's characterization capability from two‐dimensional surface analysis to three‐dimensional volumetric mapping of bulk materials. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Implementation of depth‐resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility.
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  Data: &lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Wang%2C+You-Kang%22&quot;&gt;Wang, You-Kang&lt;/searchLink&gt;&lt;relatesTo&gt;1,2&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Yang%2C+Yi-Ming%22&quot;&gt;Yang, Yi-Ming&lt;/searchLink&gt;&lt;relatesTo&gt;1&lt;/relatesTo&gt; (AUTHOR)&lt;i&gt; yangym@ihep.ac.cn&lt;/i&gt;&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Li%2C+Run-Guang%22&quot;&gt;Li, Run-Guang&lt;/searchLink&gt;&lt;relatesTo&gt;3&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Yu%2C+Dong-Hai%22&quot;&gt;Yu, Dong-Hai&lt;/searchLink&gt;&lt;relatesTo&gt;3&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Wang%2C+Si-Sheng%22&quot;&gt;Wang, Si-Sheng&lt;/searchLink&gt;&lt;relatesTo&gt;4&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Wang%2C+Zhi-Jun%22&quot;&gt;Wang, Zhi-Jun&lt;/searchLink&gt;&lt;relatesTo&gt;4&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Liu%2C+Peng%22&quot;&gt;Liu, Peng&lt;/searchLink&gt;&lt;relatesTo&gt;1,5&lt;/relatesTo&gt; (AUTHOR)&lt;br /&gt;&lt;searchLink fieldCode=&quot;AR&quot; term=&quot;%22Wang%2C+Yan-Dong%22&quot;&gt;Wang, Yan-Dong&lt;/searchLink&gt;&lt;relatesTo&gt;3&lt;/relatesTo&gt; (AUTHOR)&lt;i&gt; ydwang@ustb.edu.cn&lt;/i&gt;
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  Data: &lt;searchLink fieldCode=&quot;JN&quot; term=&quot;%22Journal+of+Applied+Crystallography%22&quot;&gt;Journal of Applied Crystallography&lt;/searchLink&gt;. Jun2026, Vol. 59 Issue 3, p923-931. 9p.
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– Name: Abstract
  Label: Abstract
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  Data: White‐beam X‐ray microdiffraction is a non‐destructive technique for probing microstructure and micromechanical behavior on the mesoscopic scale. Making use of the high throughput of Laue diffraction and advanced X‐ray focusing optics, this technique enables efficient point‐by‐point mapping of local crystal structure, lattice rotation and elastic strain with submicrometre spatial resolution. However, the deep penetration of X‐rays leads to a signal averaging effect along the beam path in bulk materials, which severely restricts further application of conventional microdiffraction. Herein, we report the successful implementation of differential aperture X‐ray microscopy on the standard Laue microdiffraction beamline (BL03HB) at the Shanghai Synchrotron Radiation Facility, China. Using a step‐scanned absorbing wire as a depth profiler for diffracted beams, the beamline is endowed with depth‐resolved analytical capability. We have also developed an efficient geometric parameter calibration method and screened a robust optimization algorithm for diffraction signal depth reconstruction via forward simulations. This implementation enabled the acquisition of depth‐resolved crystallographic information from a bulk silicon bimorph and a nickel‐based single‐crystal superalloy, with a depth resolution of &lt;10 &#181;m. These results lay a solid foundation for expanding the beamline&#39;s characterization capability from two‐dimensional surface analysis to three‐dimensional volumetric mapping of bulk materials. [ABSTRACT FROM AUTHOR]
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  Data: &lt;i&gt;Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder&#39;s express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.&lt;/i&gt; (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1107/S1600576726004073
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 9
        StartPage: 923
    Subjects:
      – SubjectFull: Depth profiling
        Type: general
      – SubjectFull: Synchrotrons
        Type: general
      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: Solids
        Type: general
      – SubjectFull: Crystallography
        Type: general
      – SubjectFull: Elastic deformation
        Type: general
      – SubjectFull: China
        Type: general
    Titles:
      – TitleFull: Implementation of depth‐resolved Laue microdiffraction by wire profiling at the Shanghai Synchrotron Radiation Facility.
        Type: main
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            NameFull: Wang, You-Kang
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            NameFull: Yang, Yi-Ming
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            NameFull: Li, Run-Guang
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            NameFull: Yu, Dong-Hai
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            NameFull: Wang, Si-Sheng
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            NameFull: Wang, Zhi-Jun
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            NameFull: Liu, Peng
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            NameFull: Wang, Yan-Dong
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            – D: 01
              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 00218898
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              Value: 59
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            – TitleFull: Journal of Applied Crystallography
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