2005 International Test Conference.
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| Title: | 2005 International Test Conference. |
|---|---|
| Authors: | Butler, Ken1 |
| Source: | IEEE Design & Test of Computers. Jan/Feb2006, Vol. 23 Issue 1, p71-71. 1p. |
| Subjects: | Conferences & conventions, Electronic circuit testing equipment industry, Testing equipment industry, Technological innovations, High technology |
| Geographic Terms: | Austin (Tex.), Texas |
| Abstract: | The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing. |
| Database: | Engineering Source |
| Abstract: | The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing. |
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| ISSN: | 07407475 |
| DOI: | 10.1109/MDT.2006.8 |
