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2005 International Test Conference.

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Bibliographic Details
Title: 2005 International Test Conference.
Authors: Butler, Ken1
Source: IEEE Design & Test of Computers. Jan/Feb2006, Vol. 23 Issue 1, p71-71. 1p.
Subjects: Conferences & conventions, Electronic circuit testing equipment industry, Testing equipment industry, Technological innovations, High technology
Geographic Terms: Austin (Tex.), Texas
Abstract: The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing.
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 19462910
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
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  Data: 2005 International Test Conference.
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Design+%26+Test+of+Computers%22">IEEE Design & Test of Computers</searchLink>. Jan/Feb2006, Vol. 23 Issue 1, p71-71. 1p.
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  Data: <searchLink fieldCode="DE" term="%22Conferences+%26+conventions%22">Conferences & conventions</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+circuit+testing+equipment+industry%22">Electronic circuit testing equipment industry</searchLink><br /><searchLink fieldCode="DE" term="%22Testing+equipment+industry%22">Testing equipment industry</searchLink><br /><searchLink fieldCode="DE" term="%22Technological+innovations%22">Technological innovations</searchLink><br /><searchLink fieldCode="DE" term="%22High+technology%22">High technology</searchLink>
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  Data: The article presents the proceedings of the IEEE International Test Conference in Austin, Texas from November 8-10, 2005. Several papers and research works presented and discussed in the event. New technologies such as submicron technology have been developed for the test industries. The conference introduced seminars on testing areas such as delay testing, mixed-signal and radio frequency testing, microprocessor testing and debug, and very-high-frequency and jitter testing.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=19462910
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/MDT.2006.8
    Languages:
      – Code: eng
        Text: English
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        PageCount: 1
        StartPage: 71
    Subjects:
      – SubjectFull: Conferences & conventions
        Type: general
      – SubjectFull: Electronic circuit testing equipment industry
        Type: general
      – SubjectFull: Testing equipment industry
        Type: general
      – SubjectFull: Technological innovations
        Type: general
      – SubjectFull: High technology
        Type: general
      – SubjectFull: Austin (Tex.)
        Type: general
      – SubjectFull: Texas
        Type: general
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      – TitleFull: 2005 International Test Conference.
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            NameFull: Butler, Ken
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            – D: 01
              M: 01
              Text: Jan/Feb2006
              Type: published
              Y: 2006
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