View in EDS

Correlation between extrinsic magnetoresistance and electroresistance in La0.6Pb0.4MnO3 thin films as revealed from current–voltage and ferromagnetic resonance studies

Saved in:
Bibliographic Details
Title: Correlation between extrinsic magnetoresistance and electroresistance in La0.6Pb0.4MnO3 thin films as revealed from current–voltage and ferromagnetic resonance studies
Authors: Singh, Ajay1 asb_barc@yahoo.com, Aswal, D.K.1, Chowdhury, P.1, Padma, N.1, Kadam, R.M.2, Babu, Y.2, Kumar, M.L. Jayanth2, Viswanadham, C.S.3, Kumar, Santosh3, Gupta, S.K.1, Yakhmi, J.V.1
Source: Solid State Communications. Jun2006, Vol. 138 Issue 9, p430-435. 6p.
Subjects: Crystal growth, Thin films, Magnetic resonance, Free electron theory of metals
Abstract: Abstract: We have investigated magnetoresistance (MR) and electroresistance (ER) of well characterized La0.6Pb0.4MnO3 (LPMO) films having two different crystallinity (i) (00l) oriented single-crystalline, SC, i.e. without any grain boundaries, and (ii) nanocrystalline, NC, with an average grain size of 17nm. Both MR and ER were remarkably different for the two films, that is, (i) NC films exhibited a highest MR of ∼100% near the metal-insulator transition temperature; while for SC films the MR was in the range of 40–60%, (ii) NC films exhibited a finite ER, which increased monotonically with decreasing temperature; while in SC films ER was completely absent. Using current–voltage characteristic and ferromagnetic resonance studies we demonstrate that both enhanced MR and ER in NC films are extrinsic in nature and originate due to the presence of spin glassy grain boundaries. [Copyright &y& Elsevier]
Copyright of Solid State Communications is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Description
Abstract:Abstract: We have investigated magnetoresistance (MR) and electroresistance (ER) of well characterized La0.6Pb0.4MnO3 (LPMO) films having two different crystallinity (i) (00l) oriented single-crystalline, SC, i.e. without any grain boundaries, and (ii) nanocrystalline, NC, with an average grain size of 17nm. Both MR and ER were remarkably different for the two films, that is, (i) NC films exhibited a highest MR of ∼100% near the metal-insulator transition temperature; while for SC films the MR was in the range of 40–60%, (ii) NC films exhibited a finite ER, which increased monotonically with decreasing temperature; while in SC films ER was completely absent. Using current–voltage characteristic and ferromagnetic resonance studies we demonstrate that both enhanced MR and ER in NC films are extrinsic in nature and originate due to the presence of spin glassy grain boundaries. [Copyright &y& Elsevier]
ISSN:00381098
DOI:10.1016/j.ssc.2006.04.012