Correlation between extrinsic magnetoresistance and electroresistance in La0.6Pb0.4MnO3 thin films as revealed from current–voltage and ferromagnetic resonance studies
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| Title: | Correlation between extrinsic magnetoresistance and electroresistance in La |
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| Authors: | Singh, Ajay1 asb_barc@yahoo.com, Aswal, D.K.1, Chowdhury, P.1, Padma, N.1, Kadam, R.M.2, Babu, Y.2, Kumar, M.L. Jayanth2, Viswanadham, C.S.3, Kumar, Santosh3, Gupta, S.K.1, Yakhmi, J.V.1 |
| Source: | Solid State Communications. Jun2006, Vol. 138 Issue 9, p430-435. 6p. |
| Subjects: | Crystal growth, Thin films, Magnetic resonance, Free electron theory of metals |
| Abstract: | Abstract: We have investigated magnetoresistance (MR) and electroresistance (ER) of well characterized La0.6Pb0.4MnO3 (LPMO) films having two different crystallinity (i) (00l) oriented single-crystalline, SC, i.e. without any grain boundaries, and (ii) nanocrystalline, NC, with an average grain size of 17nm. Both MR and ER were remarkably different for the two films, that is, (i) NC films exhibited a highest MR of ∼100% near the metal-insulator transition temperature; while for SC films the MR was in the range of 40–60%, (ii) NC films exhibited a finite ER, which increased monotonically with decreasing temperature; while in SC films ER was completely absent. Using current–voltage characteristic and ferromagnetic resonance studies we demonstrate that both enhanced MR and ER in NC films are extrinsic in nature and originate due to the presence of spin glassy grain boundaries. [Copyright &y& Elsevier] |
| Copyright of Solid State Communications is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 20963931 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Correlation between extrinsic magnetoresistance and electroresistance in La<subscript>0.6</subscript>Pb<subscript>0.4</subscript>MnO<subscript>3</subscript> thin films as revealed from current–voltage and ferromagnetic resonance studies – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Singh%2C+Ajay%22">Singh, Ajay</searchLink><relatesTo>1</relatesTo><i> asb_barc@yahoo.com</i><br /><searchLink fieldCode="AR" term="%22Aswal%2C+D%2EK%2E%22">Aswal, D.K.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Chowdhury%2C+P%2E%22">Chowdhury, P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Padma%2C+N%2E%22">Padma, N.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Kadam%2C+R%2EM%2E%22">Kadam, R.M.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Babu%2C+Y%2E%22">Babu, Y.</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Kumar%2C+M%2EL%2E+Jayanth%22">Kumar, M.L. Jayanth</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Viswanadham%2C+C%2ES%2E%22">Viswanadham, C.S.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Kumar%2C+Santosh%22">Kumar, Santosh</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Gupta%2C+S%2EK%2E%22">Gupta, S.K.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Yakhmi%2C+J%2EV%2E%22">Yakhmi, J.V.</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Solid+State+Communications%22">Solid State Communications</searchLink>. Jun2006, Vol. 138 Issue 9, p430-435. 6p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Crystal+growth%22">Crystal growth</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Magnetic+resonance%22">Magnetic resonance</searchLink><br /><searchLink fieldCode="DE" term="%22Free+electron+theory+of+metals%22">Free electron theory of metals</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Abstract: We have investigated magnetoresistance (MR) and electroresistance (ER) of well characterized La0.6Pb0.4MnO3 (LPMO) films having two different crystallinity (i) (00l) oriented single-crystalline, SC, i.e. without any grain boundaries, and (ii) nanocrystalline, NC, with an average grain size of 17nm. Both MR and ER were remarkably different for the two films, that is, (i) NC films exhibited a highest MR of ∼100% near the metal-insulator transition temperature; while for SC films the MR was in the range of 40–60%, (ii) NC films exhibited a finite ER, which increased monotonically with decreasing temperature; while in SC films ER was completely absent. Using current–voltage characteristic and ferromagnetic resonance studies we demonstrate that both enhanced MR and ER in NC films are extrinsic in nature and originate due to the presence of spin glassy grain boundaries. [Copyright &y& Elsevier] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Solid State Communications is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.ssc.2006.04.012 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 6 StartPage: 430 Subjects: – SubjectFull: Crystal growth Type: general – SubjectFull: Thin films Type: general – SubjectFull: Magnetic resonance Type: general – SubjectFull: Free electron theory of metals Type: general Titles: – TitleFull: Correlation between extrinsic magnetoresistance and electroresistance in La0.6Pb0.4MnO3 thin films as revealed from current–voltage and ferromagnetic resonance studies Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Singh, Ajay – PersonEntity: Name: NameFull: Aswal, D.K. – PersonEntity: Name: NameFull: Chowdhury, P. – PersonEntity: Name: NameFull: Padma, N. – PersonEntity: Name: NameFull: Kadam, R.M. – PersonEntity: Name: NameFull: Babu, Y. – PersonEntity: Name: NameFull: Kumar, M.L. Jayanth – PersonEntity: Name: NameFull: Viswanadham, C.S. – PersonEntity: Name: NameFull: Kumar, Santosh – PersonEntity: Name: NameFull: Gupta, S.K. – PersonEntity: Name: NameFull: Yakhmi, J.V. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2006 Type: published Y: 2006 Identifiers: – Type: issn-print Value: 00381098 Numbering: – Type: volume Value: 138 – Type: issue Value: 9 Titles: – TitleFull: Solid State Communications Type: main |
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