Applications of Fast Scanning Tunneling Microscopy: A Review.
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| Title: | Applications of Fast Scanning Tunneling Microscopy: A Review. |
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| Authors: | Wu, Qi-Hui1 (AUTHOR) qihui_wu@xmu.edu.cn, Kang, Junyong1 (AUTHOR) |
| Source: | Materials & Manufacturing Processes. Jan2007, Vol. 22 Issue 1, p22-27. 6p. 2 Black and White Photographs. |
| Subjects: | Scanning tunneling microscopy, Semiconductor diffusion, Crystal growth, Crystal grain boundaries, Transition metal oxides, Electronic structure |
| Abstract: | This article briefly reviews the recent development in scanning tunneling microscope (STM) technology, namely fast STM, and mainly illustrates how this technology is continuing to expand and enter new scientific and technological territory. [ABSTRACT FROM AUTHOR] |
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| Database: | Engineering Source |
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| Abstract: | This article briefly reviews the recent development in scanning tunneling microscope (STM) technology, namely fast STM, and mainly illustrates how this technology is continuing to expand and enter new scientific and technological territory. [ABSTRACT FROM AUTHOR] |
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| ISSN: | 10426914 |
| DOI: | 10.1080/10426910601015824 |
