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Applications of Fast Scanning Tunneling Microscopy: A Review.

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Title: Applications of Fast Scanning Tunneling Microscopy: A Review.
Authors: Wu, Qi-Hui1 (AUTHOR) qihui_wu@xmu.edu.cn, Kang, Junyong1 (AUTHOR)
Source: Materials & Manufacturing Processes. Jan2007, Vol. 22 Issue 1, p22-27. 6p. 2 Black and White Photographs.
Subjects: Scanning tunneling microscopy, Semiconductor diffusion, Crystal growth, Crystal grain boundaries, Transition metal oxides, Electronic structure
Abstract: This article briefly reviews the recent development in scanning tunneling microscope (STM) technology, namely fast STM, and mainly illustrates how this technology is continuing to expand and enter new scientific and technological territory. [ABSTRACT FROM AUTHOR]
Copyright of Materials & Manufacturing Processes is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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Header DbId: egs
DbLabel: Engineering Source
An: 23518827
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
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  Data: Applications of Fast Scanning Tunneling Microscopy: A Review.
– Name: Author
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  Data: <searchLink fieldCode="AR" term="%22Wu%2C+Qi-Hui%22">Wu, Qi-Hui</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> qihui_wu@xmu.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Kang%2C+Junyong%22">Kang, Junyong</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Materials+%26+Manufacturing+Processes%22">Materials & Manufacturing Processes</searchLink>. Jan2007, Vol. 22 Issue 1, p22-27. 6p. 2 Black and White Photographs.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22Scanning+tunneling+microscopy%22">Scanning tunneling microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+diffusion%22">Semiconductor diffusion</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+growth%22">Crystal growth</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+grain+boundaries%22">Crystal grain boundaries</searchLink><br /><searchLink fieldCode="DE" term="%22Transition+metal+oxides%22">Transition metal oxides</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+structure%22">Electronic structure</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: This article briefly reviews the recent development in scanning tunneling microscope (STM) technology, namely fast STM, and mainly illustrates how this technology is continuing to expand and enter new scientific and technological territory. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Materials & Manufacturing Processes is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1080/10426910601015824
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 22
    Subjects:
      – SubjectFull: Scanning tunneling microscopy
        Type: general
      – SubjectFull: Semiconductor diffusion
        Type: general
      – SubjectFull: Crystal growth
        Type: general
      – SubjectFull: Crystal grain boundaries
        Type: general
      – SubjectFull: Transition metal oxides
        Type: general
      – SubjectFull: Electronic structure
        Type: general
    Titles:
      – TitleFull: Applications of Fast Scanning Tunneling Microscopy: A Review.
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            NameFull: Wu, Qi-Hui
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            NameFull: Kang, Junyong
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            – D: 01
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              Text: Jan2007
              Type: published
              Y: 2007
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            – TitleFull: Materials & Manufacturing Processes
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