The revenge of the Patterson methods. II. Substructure applications.
Saved in:
| Title: | The revenge of the Patterson methods. II. Substructure applications. |
|---|---|
| Authors: | Burla, Maria Cristina1, Caliandro, Rocco2, Carrozzini, Benedetta2, Cascarano, Giovanni Luca2, De Caro, Liberato2, Giacovazzo, Carmelo2,3 carmelo.giacovazzo@ic.cnr.it, Polidori, Giampiero1, Siliqi, Dritan2 |
| Source: | Journal of Applied Crystallography. Apr2007, Vol. 40 Issue 2, p211-217. 7p. 4 Charts, 4 Graphs. |
| Subjects: | Patterson function, Crystallography, Optical diffraction, Electron distribution, Wavelengths |
| Abstract: | The Patterson techniques, recently developed by the same authors for the ab initio crystal structure solution of proteins, have been applied to single and multiple anomalous diffraction (SAD and MAD) data to find the substructure of the anomalous scatterers. An automatic procedure has been applied to a large set of test structures, some of which were originally solved with remarkable difficulty. In all cases, the procedure automatically leads to interpretable electron density maps. Patterson techniques have been compared with direct methods; the former seem to be more efficient than the latter, so confirming the results obtained for ab initio phasing, and disproving the common belief that they could only be applied to determine large equal-atom substructures with difficulty. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 24458078 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: The revenge of the Patterson methods. II. Substructure applications. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Burla%2C+Maria+Cristina%22">Burla, Maria Cristina</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Caliandro%2C+Rocco%22">Caliandro, Rocco</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Carrozzini%2C+Benedetta%22">Carrozzini, Benedetta</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Cascarano%2C+Giovanni+Luca%22">Cascarano, Giovanni Luca</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22De+Caro%2C+Liberato%22">De Caro, Liberato</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AR" term="%22Giacovazzo%2C+Carmelo%22">Giacovazzo, Carmelo</searchLink><relatesTo>2,3</relatesTo><i> carmelo.giacovazzo@ic.cnr.it</i><br /><searchLink fieldCode="AR" term="%22Polidori%2C+Giampiero%22">Polidori, Giampiero</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Siliqi%2C+Dritan%22">Siliqi, Dritan</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Apr2007, Vol. 40 Issue 2, p211-217. 7p. 4 Charts, 4 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Patterson+function%22">Patterson function</searchLink><br /><searchLink fieldCode="DE" term="%22Crystallography%22">Crystallography</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+diffraction%22">Optical diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+distribution%22">Electron distribution</searchLink><br /><searchLink fieldCode="DE" term="%22Wavelengths%22">Wavelengths</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The Patterson techniques, recently developed by the same authors for the ab initio crystal structure solution of proteins, have been applied to single and multiple anomalous diffraction (SAD and MAD) data to find the substructure of the anomalous scatterers. An automatic procedure has been applied to a large set of test structures, some of which were originally solved with remarkable difficulty. In all cases, the procedure automatically leads to interpretable electron density maps. Patterson techniques have been compared with direct methods; the former seem to be more efficient than the latter, so confirming the results obtained for ab initio phasing, and disproving the common belief that they could only be applied to determine large equal-atom substructures with difficulty. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=24458078 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1107/S0021889806052058 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 211 Subjects: – SubjectFull: Patterson function Type: general – SubjectFull: Crystallography Type: general – SubjectFull: Optical diffraction Type: general – SubjectFull: Electron distribution Type: general – SubjectFull: Wavelengths Type: general Titles: – TitleFull: The revenge of the Patterson methods. II. Substructure applications. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Burla, Maria Cristina – PersonEntity: Name: NameFull: Caliandro, Rocco – PersonEntity: Name: NameFull: Carrozzini, Benedetta – PersonEntity: Name: NameFull: Cascarano, Giovanni Luca – PersonEntity: Name: NameFull: De Caro, Liberato – PersonEntity: Name: NameFull: Giacovazzo, Carmelo – PersonEntity: Name: NameFull: Polidori, Giampiero – PersonEntity: Name: NameFull: Siliqi, Dritan IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2007 Type: published Y: 2007 Identifiers: – Type: issn-print Value: 00218898 Numbering: – Type: volume Value: 40 – Type: issue Value: 2 Titles: – TitleFull: Journal of Applied Crystallography Type: main |
| ResultId | 1 |