Alam, S. R., Barrett, R. F., Fahey, M. R., Kuehn, J. A., Messer, O. E. B., Mills, R. T., . . . Worley, P. H. (2008). AN EVALUATION OF THE OAK RIDGE NATIONAL LABORATORY CRAY XT3. International Journal of High Performance Computing Applications, 22(1), 52. https://doi.org/10.1177/1094342007085019
Chicago Style (17th ed.) CitationAlam, Sadaf R., Richard F. Barrett, Mark R. Fahey, Jeffery A. Kuehn, O. E. Bronson Messer, Richard T. Mills, Philip C. Roth, Jeftrey S. Vetter, and Patrick H. Worley. "AN EVALUATION OF THE OAK RIDGE NATIONAL LABORATORY CRAY XT3." International Journal of High Performance Computing Applications 22, no. 1 (2008): 52. https://doi.org/10.1177/1094342007085019.
MLA (9th ed.) CitationAlam, Sadaf R., et al. "AN EVALUATION OF THE OAK RIDGE NATIONAL LABORATORY CRAY XT3." International Journal of High Performance Computing Applications, vol. 22, no. 1, 2008, p. 52, https://doi.org/10.1177/1094342007085019.