Bibliographic Details
| Title: |
Linking Statistical Learning to Diagnosis. |
| Authors: |
Bastani, Pouria1, Li-C. Wang1, Abadir, Magdy S.2 |
| Source: |
IEEE Design & Test of Computers. May/Jun2008, Vol. 25 Issue 3, p232-239. 8p. |
| Subjects: |
Integrated circuits, Electronic circuits, Semiconductors, Systems design, Information technology |
| Abstract: |
The article focuses on a study which examined the systematic effects of design-silicon timing behavior mismatch between design and silicon chip. The study revealed that design-silicon timing mismatch between design and silicon chip develops data that is always corrupted by unknown statistical random noise. It was also found that the design-silicon timing behavior mismatch is the result of the unmodeled systematic and random timing. |
| Database: |
Engineering Source |