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Linking Statistical Learning to Diagnosis.

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Bibliographic Details
Title: Linking Statistical Learning to Diagnosis.
Authors: Bastani, Pouria1, Li-C. Wang1, Abadir, Magdy S.2
Source: IEEE Design & Test of Computers. May/Jun2008, Vol. 25 Issue 3, p232-239. 8p.
Subjects: Integrated circuits, Electronic circuits, Semiconductors, Systems design, Information technology
Abstract: The article focuses on a study which examined the systematic effects of design-silicon timing behavior mismatch between design and silicon chip. The study revealed that design-silicon timing mismatch between design and silicon chip develops data that is always corrupted by unknown statistical random noise. It was also found that the design-silicon timing behavior mismatch is the result of the unmodeled systematic and random timing.
Database: Engineering Source
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  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 32510659
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
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  Data: Linking Statistical Learning to Diagnosis.
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  Data: <searchLink fieldCode="AR" term="%22Bastani%2C+Pouria%22">Bastani, Pouria</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Li-C%2E+Wang%22">Li-C. Wang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Abadir%2C+Magdy+S%2E%22">Abadir, Magdy S.</searchLink><relatesTo>2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Design+%26+Test+of+Computers%22">IEEE Design & Test of Computers</searchLink>. May/Jun2008, Vol. 25 Issue 3, p232-239. 8p.
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  Data: <searchLink fieldCode="DE" term="%22Integrated+circuits%22">Integrated circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+circuits%22">Electronic circuits</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductors%22">Semiconductors</searchLink><br /><searchLink fieldCode="DE" term="%22Systems+design%22">Systems design</searchLink><br /><searchLink fieldCode="DE" term="%22Information+technology%22">Information technology</searchLink>
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  Label: Abstract
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  Data: The article focuses on a study which examined the systematic effects of design-silicon timing behavior mismatch between design and silicon chip. The study revealed that design-silicon timing mismatch between design and silicon chip develops data that is always corrupted by unknown statistical random noise. It was also found that the design-silicon timing behavior mismatch is the result of the unmodeled systematic and random timing.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=32510659
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/MDT.2008.79
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 232
    Subjects:
      – SubjectFull: Integrated circuits
        Type: general
      – SubjectFull: Electronic circuits
        Type: general
      – SubjectFull: Semiconductors
        Type: general
      – SubjectFull: Systems design
        Type: general
      – SubjectFull: Information technology
        Type: general
    Titles:
      – TitleFull: Linking Statistical Learning to Diagnosis.
        Type: main
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          Name:
            NameFull: Bastani, Pouria
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            NameFull: Li-C. Wang
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            NameFull: Abadir, Magdy S.
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            – D: 01
              M: 05
              Text: May/Jun2008
              Type: published
              Y: 2008
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              Value: 07407475
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              Value: 25
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              Value: 3
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            – TitleFull: IEEE Design & Test of Computers
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