View in EDS

Structural and chemical analyses of sputtered In x S y buffer layers in Cu(In,Ga)Se2 thin-film solar cells

Saved in:
Bibliographic Details
Title: Structural and chemical analyses of sputtered In x S y buffer layers in Cu(In,Ga)Se2 thin-film solar cells
Authors: Abou-Ras, D.1,2 daniel.abou-ras@helmholtz-berlin.de, Kostorz, G.1, Hariskos, D.3, Menner, R.3, Powalla, M.3, Schorr, S.4, Tiwari, A.N.2,5
Source: Thin Solid Films. Feb2009, Vol. 517 Issue 8, p2792-2798. 7p.
Subjects: Sulfides, Sputtering (Physics), Structural analysis (Science), Copper compounds, Thin films, Solar cells, Substrates (Materials science), Transmission electron microscopy
Abstract: Abstract: Sputtered In x S y layers deposited on borosilicate glass and Si at substrate temperatures ranging from about 60 °C to 340 °C were analyzed by means of X-ray diffraction, energy-dispersive X-ray spectrometry, and optical transmission and reflection measurements. With increasing substrate temperature, the In x S y layers exhibit increasing sulfur concentration and also increasing absorption-edge energies. In x S y layers on Cu(In,Ga)Se2(CIGS)/Mo/glass stacks were additionally studied by scanning and transmission electron microscopy. With increasing substrate temperature, Cu, Ga, and In interdiffusion between CIGS and In x S y becomes more enhanced. At 340 °C, CuIn5S8 forms instead of In x S y . The CuIn5S8 formation at elevated temperatures may be the reason for the very low efficiency of solar cells with indium sulfide buffers deposited at temperatures above about 250 °C by various techniques. [Copyright &y& Elsevier]
Copyright of Thin Solid Films is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 36388534
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Structural and chemical analyses of sputtered In<subscript> x </subscript>S<subscript> y </subscript> buffer layers in Cu(In,Ga)Se<subscript>2</subscript> thin-film solar cells
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Abou-Ras%2C+D%2E%22">Abou-Ras, D.</searchLink><relatesTo>1,2</relatesTo><i> daniel.abou-ras@helmholtz-berlin.de</i><br /><searchLink fieldCode="AR" term="%22Kostorz%2C+G%2E%22">Kostorz, G.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Hariskos%2C+D%2E%22">Hariskos, D.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Menner%2C+R%2E%22">Menner, R.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Powalla%2C+M%2E%22">Powalla, M.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AR" term="%22Schorr%2C+S%2E%22">Schorr, S.</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AR" term="%22Tiwari%2C+A%2EN%2E%22">Tiwari, A.N.</searchLink><relatesTo>2,5</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Thin+Solid+Films%22">Thin Solid Films</searchLink>. Feb2009, Vol. 517 Issue 8, p2792-2798. 7p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Sulfides%22">Sulfides</searchLink><br /><searchLink fieldCode="DE" term="%22Sputtering+%28Physics%29%22">Sputtering (Physics)</searchLink><br /><searchLink fieldCode="DE" term="%22Structural+analysis+%28Science%29%22">Structural analysis (Science)</searchLink><br /><searchLink fieldCode="DE" term="%22Copper+compounds%22">Copper compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Solar+cells%22">Solar cells</searchLink><br /><searchLink fieldCode="DE" term="%22Substrates+%28Materials+science%29%22">Substrates (Materials science)</searchLink><br /><searchLink fieldCode="DE" term="%22Transmission+electron+microscopy%22">Transmission electron microscopy</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Abstract: Sputtered In x S y layers deposited on borosilicate glass and Si at substrate temperatures ranging from about 60 °C to 340 °C were analyzed by means of X-ray diffraction, energy-dispersive X-ray spectrometry, and optical transmission and reflection measurements. With increasing substrate temperature, the In x S y layers exhibit increasing sulfur concentration and also increasing absorption-edge energies. In x S y layers on Cu(In,Ga)Se2(CIGS)/Mo/glass stacks were additionally studied by scanning and transmission electron microscopy. With increasing substrate temperature, Cu, Ga, and In interdiffusion between CIGS and In x S y becomes more enhanced. At 340 °C, CuIn5S8 forms instead of In x S y . The CuIn5S8 formation at elevated temperatures may be the reason for the very low efficiency of solar cells with indium sulfide buffers deposited at temperatures above about 250 °C by various techniques. [Copyright &y& Elsevier]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Thin Solid Films is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=36388534
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.tsf.2008.10.138
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 2792
    Subjects:
      – SubjectFull: Sulfides
        Type: general
      – SubjectFull: Sputtering (Physics)
        Type: general
      – SubjectFull: Structural analysis (Science)
        Type: general
      – SubjectFull: Copper compounds
        Type: general
      – SubjectFull: Thin films
        Type: general
      – SubjectFull: Solar cells
        Type: general
      – SubjectFull: Substrates (Materials science)
        Type: general
      – SubjectFull: Transmission electron microscopy
        Type: general
    Titles:
      – TitleFull: Structural and chemical analyses of sputtered In x S y buffer layers in Cu(In,Ga)Se2 thin-film solar cells
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Abou-Ras, D.
      – PersonEntity:
          Name:
            NameFull: Kostorz, G.
      – PersonEntity:
          Name:
            NameFull: Hariskos, D.
      – PersonEntity:
          Name:
            NameFull: Menner, R.
      – PersonEntity:
          Name:
            NameFull: Powalla, M.
      – PersonEntity:
          Name:
            NameFull: Schorr, S.
      – PersonEntity:
          Name:
            NameFull: Tiwari, A.N.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 27
              M: 02
              Text: Feb2009
              Type: published
              Y: 2009
          Identifiers:
            – Type: issn-print
              Value: 00406090
          Numbering:
            – Type: volume
              Value: 517
            – Type: issue
              Value: 8
          Titles:
            – TitleFull: Thin Solid Films
              Type: main
ResultId 1