View in EDS

Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies

Saved in:
Bibliographic Details
Title: Multi-valued logic mapping of resistive short and open delay-fault testing in deep sub-micron technologies
Authors: Javaheri, Reza1, Sedaghat, Reza http://www.ee.ryerson.ca/opr
Source: Microelectronics Reliability. Feb2009, Vol. 49 Issue 2, p178-185. 8p.
Subjects: Semiconductor defects, Delay faults (Semiconductors), Semiconductors testing, Many-valued logic, Algorithms, Mathematical mappings, Technological innovations
Abstract: Abstract: In advanced technologies an increasing proportion of defects manifest themselves as small delay faults. Most of today’s advanced delay-fault algorithms are able to propagate those delay faults which create logic or glitch faults. An algorithm is proposed for circuit fault diagnosis in deep sub-micron technology to propagate the actual timing faults as well as those delay faults that eventually create logic faults to the primary outputs. Unlike the backtrack algorithm that predicts the fault site by tracing the syndrome at a faulty output back into the circuit, this approach propagates the fault from the fault site by mapping a nine-valued voltage model on top of a five-valued voltage model. In such a forward approach, accuracy is greatly increased since all composite syndromes at all faulty outputs are considered simultaneously. As a result, the proposed approach is applicable even when the delay size is relatively small. Experimental results show that the number of fault candidates produced by this approach is considerable. [Copyright &y& Elsevier]
Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
Description
Abstract:Abstract: In advanced technologies an increasing proportion of defects manifest themselves as small delay faults. Most of today’s advanced delay-fault algorithms are able to propagate those delay faults which create logic or glitch faults. An algorithm is proposed for circuit fault diagnosis in deep sub-micron technology to propagate the actual timing faults as well as those delay faults that eventually create logic faults to the primary outputs. Unlike the backtrack algorithm that predicts the fault site by tracing the syndrome at a faulty output back into the circuit, this approach propagates the fault from the fault site by mapping a nine-valued voltage model on top of a five-valued voltage model. In such a forward approach, accuracy is greatly increased since all composite syndromes at all faulty outputs are considered simultaneously. As a result, the proposed approach is applicable even when the delay size is relatively small. Experimental results show that the number of fault candidates produced by this approach is considerable. [Copyright &y& Elsevier]
ISSN:00262714
DOI:10.1016/j.microrel.2008.11.010