APA (7th ed.) Citation

Styk, A., & Patorski, K. (2009). Silicon microelement vibration testing using conventional and heterodyned time-average interferometry with automated temporal and spatial phase stepping. Optics & Lasers in Engineering, 47(3/4), 504. https://doi.org/10.1016/j.optlaseng.2008.03.004

Chicago Style (17th ed.) Citation

Styk, Adam, and Krzysztof Patorski. "Silicon Microelement Vibration Testing Using Conventional and Heterodyned Time-average Interferometry with Automated Temporal and Spatial Phase Stepping." Optics & Lasers in Engineering 47, no. 3/4 (2009): 504. https://doi.org/10.1016/j.optlaseng.2008.03.004.

MLA (9th ed.) Citation

Styk, Adam, and Krzysztof Patorski. "Silicon Microelement Vibration Testing Using Conventional and Heterodyned Time-average Interferometry with Automated Temporal and Spatial Phase Stepping." Optics & Lasers in Engineering, vol. 47, no. 3/4, 2009, p. 504, https://doi.org/10.1016/j.optlaseng.2008.03.004.