An analysis of a kick-out diffusion mechanism with charge effects.

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Title: An analysis of a kick-out diffusion mechanism with charge effects.
Authors: Meere, MG
Source: Quarterly Journal of Mechanics & Applied Mathematics. Nov98, Vol. 51 Issue 4, p515. 27p.
Subjects: Impurity distribution in semiconductors, Semiconductor diffusion
Abstract: In this paper we analyse a kick-out model for impurity diffusion in compound semiconductors. The form for the model described here has not previously appeared in the literature. The substitutional impurities are fixed to be singly negatively charged while the self-interstitials are taken to be neutral. The charge on the interstitial impurity atoms can take any integer value. Both one- and two-dimensional in-diffusion problems are studied. It is found that the impurity diffusion is quite sensitive to the charge on the impurity interstitials. [ABSTRACT FROM AUTHOR]
Copyright of Quarterly Journal of Mechanics & Applied Mathematics is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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An: 4337521
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: An analysis of a kick-out diffusion mechanism with charge effects.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Meere%2C+MG%22">Meere, MG</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Quarterly+Journal+of+Mechanics+%26+Applied+Mathematics%22">Quarterly Journal of Mechanics & Applied Mathematics</searchLink>. Nov98, Vol. 51 Issue 4, p515. 27p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Impurity+distribution+in+semiconductors%22">Impurity distribution in semiconductors</searchLink><br /><searchLink fieldCode="DE" term="%22Semiconductor+diffusion%22">Semiconductor diffusion</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: In this paper we analyse a kick-out model for impurity diffusion in compound semiconductors. The form for the model described here has not previously appeared in the literature. The substitutional impurities are fixed to be singly negatively charged while the self-interstitials are taken to be neutral. The charge on the interstitial impurity atoms can take any integer value. Both one- and two-dimensional in-diffusion problems are studied. It is found that the impurity diffusion is quite sensitive to the charge on the impurity interstitials. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Quarterly Journal of Mechanics & Applied Mathematics is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1093/qjmam/51.4.515
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 27
        StartPage: 515
    Subjects:
      – SubjectFull: Impurity distribution in semiconductors
        Type: general
      – SubjectFull: Semiconductor diffusion
        Type: general
    Titles:
      – TitleFull: An analysis of a kick-out diffusion mechanism with charge effects.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Meere, MG
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 11
              Text: Nov98
              Type: published
              Y: 1998
          Identifiers:
            – Type: issn-print
              Value: 00335614
          Numbering:
            – Type: volume
              Value: 51
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Quarterly Journal of Mechanics & Applied Mathematics
              Type: main
ResultId 1