Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.

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Bibliographic Details
Title:	Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.
Authors:	Chen, Fu‐Rong, Ichnose, Hideki, Kai, Ji‐Jung, Chang, Li
Source:	Journal of Electron Microscopy. Dec2001, Vol. 50 Issue 6, p529-540. 12p.
Database:	Engineering Source

Description
ISSN:	00220744
DOI:	10.1093/jmicro/50.6.529