Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.

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Title: Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.
Authors: Chen, Fu‐Rong, Ichnose, Hideki, Kai, Ji‐Jung, Chang, Li
Source: Journal of Electron Microscopy. Dec2001, Vol. 50 Issue 6, p529-540. 12p.
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 44428628
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.
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  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Chen%2C+Fu‐Rong%22">Chen, Fu‐Rong</searchLink><br /><searchLink fieldCode="AR" term="%22Ichnose%2C+Hideki%22">Ichnose, Hideki</searchLink><br /><searchLink fieldCode="AR" term="%22Kai%2C+Ji‐Jung%22">Kai, Ji‐Jung</searchLink><br /><searchLink fieldCode="AR" term="%22Chang%2C+Li%22">Chang, Li</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electron+Microscopy%22">Journal of Electron Microscopy</searchLink>. Dec2001, Vol. 50 Issue 6, p529-540. 12p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=44428628
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1093/jmicro/50.6.529
    Languages:
      – Code: eng
        Text: English
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        PageCount: 12
        StartPage: 529
    Titles:
      – TitleFull: Extension of HRTEM resolution by semi‐blind deconvolution method and Gerchberg–Saxton algorithm: application to grain boundary and interface.
        Type: main
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            NameFull: Chen, Fu‐Rong
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            NameFull: Ichnose, Hideki
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            NameFull: Kai, Ji‐Jung
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            NameFull: Chang, Li
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            – D: 01
              M: 12
              Text: Dec2001
              Type: published
              Y: 2001
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              Value: 00220744
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              Value: 50
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              Value: 6
          Titles:
            – TitleFull: Journal of Electron Microscopy
              Type: main
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