The future role of chip-scale packaging in COTS reliability.
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| Title: | The future role of chip-scale packaging in COTS reliability. |
|---|---|
| Authors: | Gurnett, Keith, Adams, Tom |
| Source: | Military & Aerospace Electronics. May2001, Vol. 12 Issue 5, p3. 3p. |
| Subjects: | Chip scale packaging, Electronic systems |
| Abstract: | Discusses the impact of ever-shrinking components for electronic systems designs on the development of chip scale packages (CSP). Use of CSP in commercial off-the-shelf military and high-reliability applications; Advantages of using CSP; History of CSP. |
| Database: | Engineering Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: egs DbLabel: Engineering Source An: 4444525 AccessLevel: 6 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The future role of chip-scale packaging in COTS reliability. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Gurnett%2C+Keith%22">Gurnett, Keith</searchLink><br /><searchLink fieldCode="AR" term="%22Adams%2C+Tom%22">Adams, Tom</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Military+%26+Aerospace+Electronics%22">Military & Aerospace Electronics</searchLink>. May2001, Vol. 12 Issue 5, p3. 3p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Chip+scale+packaging%22">Chip scale packaging</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+systems%22">Electronic systems</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Discusses the impact of ever-shrinking components for electronic systems designs on the development of chip scale packages (CSP). Use of CSP in commercial off-the-shelf military and high-reliability applications; Advantages of using CSP; History of CSP. |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=4444525 |
| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 3 StartPage: 3 Subjects: – SubjectFull: Chip scale packaging Type: general – SubjectFull: Electronic systems Type: general Titles: – TitleFull: The future role of chip-scale packaging in COTS reliability. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Gurnett, Keith – PersonEntity: Name: NameFull: Adams, Tom IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2001 Type: published Y: 2001 Identifiers: – Type: issn-print Value: 10469079 Numbering: – Type: volume Value: 12 – Type: issue Value: 5 Titles: – TitleFull: Military & Aerospace Electronics Type: main |
| ResultId | 1 |