Classification of high-voltage varistors into groups of differentiated quality
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| Title: | Classification of high-voltage varistors into groups of differentiated quality |
|---|---|
| Authors: | Hasse, Lech1, Konczakowska, Alicja alkon@eti.pg.gda.pl, Smulko, Janusz1 |
| Source: | Microelectronics Reliability. Dec2009, Vol. 49 Issue 12, p1483-1490. 8p. |
| Subjects: | Varistors, Nondestructive testing, Resonant vibration, Zinc oxide, Metallizing, Electronic appliance testing, High voltages |
| Abstract: | Abstract: The research was aimed on defining a factor of quality for high-voltage varistors using Non-Destructive Testing (NDT) techniques, which could be applied during the production testing. The newly proposed parameter Q determined on the basis of the lowest resonant frequency fr measured within the preselected frequency range was taken into account. The parameter Q was defined for ZnO structures after firing, without metallized contacts. The results of investigations allow to conclude that the parameter Q can be used as the quality factor for high-voltage varistors classification into groups of differentiated quality. [Copyright &y& Elsevier] |
| Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 45557828 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Classification of high-voltage varistors into groups of differentiated quality – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Hasse%2C+Lech%22">Hasse, Lech</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Konczakowska%2C+Alicja%22">Konczakowska, Alicja</searchLink><i> alkon@eti.pg.gda.pl</i><br /><searchLink fieldCode="AR" term="%22Smulko%2C+Janusz%22">Smulko, Janusz</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Microelectronics+Reliability%22">Microelectronics Reliability</searchLink>. Dec2009, Vol. 49 Issue 12, p1483-1490. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Varistors%22">Varistors</searchLink><br /><searchLink fieldCode="DE" term="%22Nondestructive+testing%22">Nondestructive testing</searchLink><br /><searchLink fieldCode="DE" term="%22Resonant+vibration%22">Resonant vibration</searchLink><br /><searchLink fieldCode="DE" term="%22Zinc+oxide%22">Zinc oxide</searchLink><br /><searchLink fieldCode="DE" term="%22Metallizing%22">Metallizing</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+appliance+testing%22">Electronic appliance testing</searchLink><br /><searchLink fieldCode="DE" term="%22High+voltages%22">High voltages</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Abstract: The research was aimed on defining a factor of quality for high-voltage varistors using Non-Destructive Testing (NDT) techniques, which could be applied during the production testing. The newly proposed parameter Q determined on the basis of the lowest resonant frequency fr measured within the preselected frequency range was taken into account. The parameter Q was defined for ZnO structures after firing, without metallized contacts. The results of investigations allow to conclude that the parameter Q can be used as the quality factor for high-voltage varistors classification into groups of differentiated quality. [Copyright &y& Elsevier] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Microelectronics Reliability is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.microrel.2009.06.008 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1483 Subjects: – SubjectFull: Varistors Type: general – SubjectFull: Nondestructive testing Type: general – SubjectFull: Resonant vibration Type: general – SubjectFull: Zinc oxide Type: general – SubjectFull: Metallizing Type: general – SubjectFull: Electronic appliance testing Type: general – SubjectFull: High voltages Type: general Titles: – TitleFull: Classification of high-voltage varistors into groups of differentiated quality Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Hasse, Lech – PersonEntity: Name: NameFull: Konczakowska, Alicja – PersonEntity: Name: NameFull: Smulko, Janusz IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: Dec2009 Type: published Y: 2009 Identifiers: – Type: issn-print Value: 00262714 Numbering: – Type: volume Value: 49 – Type: issue Value: 12 Titles: – TitleFull: Microelectronics Reliability Type: main |
| ResultId | 1 |
