Diffractions of Elastic Waves and Stress Concentration Near a Cylindrical Nano-Inclusion Incorporating Surface Effect.

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Bibliographic Details
Title: Diffractions of Elastic Waves and Stress Concentration Near a Cylindrical Nano-Inclusion Incorporating Surface Effect.
Authors: Ru, Y.1, Wang, G. F.1, Wang, T. J.1 wangtj@mail.xjtu.edu.cn
Source: Journal of Vibration & Acoustics. Dec2009, Vol. 131 Issue 6, p0610111-0610117. 7p. 11 Graphs.
Subjects: Elastic wave diffraction, Stress concentration, Shear waves, Elasticity, Surfaces (Technology)
Abstract: The diffractions of plane compressional waves (P-wave) and shear waves (S V-wave) by a cylindrical nano-inclusion are investigated in this paper To account for the surface! interface effect at nanoscale, the surface/interface elasticity theory is adopted in the analysis. Using the displacement potential method, we obtain the solutions for the elastic fields induced by incident Pand SV-waves near a cylindrical nano-inclusion. The results show that surface/interface has a significant effect on the diffractions of elastic waves as the radius of the inclusion shrinks to nanoscale. For incident waves with different frequencies, the effects of interfacial properties on the dynamic stress concentration around the nano-inclusion are discussed in detail. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
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Abstract:The diffractions of plane compressional waves (P-wave) and shear waves (S V-wave) by a cylindrical nano-inclusion are investigated in this paper To account for the surface! interface effect at nanoscale, the surface/interface elasticity theory is adopted in the analysis. Using the displacement potential method, we obtain the solutions for the elastic fields induced by incident Pand SV-waves near a cylindrical nano-inclusion. The results show that surface/interface has a significant effect on the diffractions of elastic waves as the radius of the inclusion shrinks to nanoscale. For incident waves with different frequencies, the effects of interfacial properties on the dynamic stress concentration around the nano-inclusion are discussed in detail. [ABSTRACT FROM AUTHOR]
ISSN:10489002
DOI:10.1115/1.4000479