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Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.

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Bibliographic Details
Title: Widening the range of high-precision quantitative measurement in retardation-modulated differential interference microscope.
Authors: Ishiwata, Hiroshi1 h•ishiwata@ot.olympus.co.jp, Nagai, Hiroki1, Naka, Toshihisa1, Itoh, Masahide1
Source: Optical Review. May2010, Vol. 17 Issue 3, p214-217. 4p.
Subjects: Measuring microscopes, Technological innovations, Contrast sensitivity (Vision), Measurement of distances, Optical instruments, Measuring instruments
Abstract: The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged.
Database: Engineering Source
Description
Abstract:The article focuses on a study related to a new technique of retardation-modulated Differential Interference Contrast (DIC) microscope that can be used in quantitative measurement. It is stated that the method uses the edges of specimen and the DIC microscope can measure the distance between images. It is inferred that the phase distribution was combined whilst moving specimen and while maintaining the characteristics of RM-DIC, measurement fields were enlarged.
ISSN:13406000
DOI:10.1007/s10043-010-0038-z