Bibliographic Details
| Title: |
Can You Measure Circumstantial Evidence? The Background of Probative Formalisms for Law. |
| Authors: |
Nissan, Ephraim |
| Source: |
Information & Communications Technology Law. Jun2001, Vol. 10 Issue 2, p231-245. 15p. 3 Charts. |
| Subjects: |
Forensic statistics, Bayesian analysis |
| Geographic Terms: |
United States |
| Abstract: |
Examines the impact of forensic statistics on Bayesian Law in the United States. Distinction between Bayesian probability and stochastic process model; Correlation between algebraic model and Bayesian model; Impact of law on moral certitude. |
| Database: |
Engineering Source |
