Peer to Patent: A Cure for Our Ailing Patent Examination System.

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Bibliographic Details
Title:	Peer to Patent: A Cure for Our Ailing Patent Examination System.
Authors:	Bestor, Daniel R. bestor@mbhb.com, Hamp, Eric¹
Source:	Northwestern Journal of Technology & Intellectual Property. Aug2010, Vol. 9 Issue 2, p16-28. 13p.
Subjects:	Patents, United States. Patent & Trademark Office, Intellectual property, Business names, Commercial law
Geographic Terms:	United States
Abstract:	The article discusses the background and status of the Peer to Patent Project, its future and features that can be incorporated into it with consideration to the inside insight and expertise of patent professionals. It cites the goal of the project to provide a higher-quality examination process at the United States Patent and Trademark Office (USPTO) and restore confidence in the patent examination system. It notes how the program improved the quality and efficiency of patent examination by sourcing the shared knowledge of the global technical community and provided a platform where the public can submit relevant art together with commentary and analysis free of charge. It refers to the project as a remedy to reduce the backlog of pending patent applications with USPTO.
Database:	Engineering Source

Description
Abstract:	The article discusses the background and status of the Peer to Patent Project, its future and features that can be incorporated into it with consideration to the inside insight and expertise of patent professionals. It cites the goal of the project to provide a higher-quality examination process at the United States Patent and Trademark Office (USPTO) and restore confidence in the patent examination system. It notes how the program improved the quality and efficiency of patent examination by sourcing the shared knowledge of the global technical community and provided a platform where the public can submit relevant art together with commentary and analysis free of charge. It refers to the project as a remedy to reduce the backlog of pending patent applications with USPTO.
ISSN:	15498271