Avalanche multiplication in GaInP/GaAs single...

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Bibliographic Details
Title: Avalanche multiplication in GaInP/GaAs single...
Authors: Flitcroft, Richard M., David, John P.R., Houston, Peter A., Button, Christopher C.
Source: IEEE Transactions on Electron Devices. Jun98, Vol. 45 Issue 6, p1207. 6p. 3 Black and White Photographs, 1 Chart, 6 Graphs.
Subjects: Photoelectric measurements, Bipolar transistors
Abstract: Provides information on a study which demonstrated the measurement of the electron multiplication factors in gallium-indium-phosphorus/gallium-arsenic (GaInP/GaAs) single heterojunction bipolar transistors (HBT) as a function of base-collector bias for a range of GaAs collector doping densities. Introduction on HBT; Discussion on the reduction in multiplication at low electric fields; Proposal for a simple correction for the dead space; Conclusion.
Database: Engineering Source
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