Nondestructive testing of the thermal resistance of Gann diodes during their manufacture.
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| Title: | Nondestructive testing of the thermal resistance of Gann diodes during their manufacture. |
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| Authors: | Yurchenko, V.1, Yurchenko, N.1 yur_med@mail.ru |
| Source: | Russian Journal of Nondestructive Testing. Apr2012, Vol. 48 Issue 4, p250-254. 5p. |
| Abstract: | The results of an investigation of the thermal resistance of Gunn diodes at different process technology cycles of their manufacturing are considered. [ABSTRACT FROM AUTHOR] |
| Copyright of Russian Journal of Nondestructive Testing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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