Bibliographic Details
| Title: |
Interferometer measurements of terahertz waves from Bi2Sr2CaCu2O8+d mesas. |
| Authors: |
Turkoglu, F.1, Koseoglu, H.1, Demirhan, Y.1, Ozyuzer, L.1 ozyuzer@iyte.edu.tr, Preu, S.2, Malzer, S.2, Simsek, Y.2, Müller, P.2, Yamamoto, T.3, Kadowaki, K.3 |
| Source: |
Superconductor Science & Technology. Dec2012, Vol. 25 Issue 12, p1-5. 5p. |
| Subjects: |
Interferometers, Terahertz spectroscopy, Bismuth compounds, Microfabrication, Ion bombardment, Liquid helium, Bolometers |
| Abstract: |
We fabricated rectangular mesa structures of superconducting Bi2Sr2CaCu2O8+d (Bi2212) using e-beam lithography and Ar ion beam etching techniques for terahertz (THz) emission. c-axis resistance versus temperature (R-T), current-voltage (I-V) characteristics and bolometric THz power measurements were performed to characterize Bi2212 mesas. The emission frequency of mesas was determined using a Michelson interferometer setup which also demonstrates polarized emission. Interference patterns of THz radiation from Bi2212 mesas were detected by various detectors such as a liquid helium cooled silicon composite bolometer, a Golay cell and a pyroelectric detector. An emitted power as high as 0.06 mW was detected from Bi2212 mesas. For the first time, most of the pumped power was extracted as THz emission from a Bi2212 mesa. The radiation at 0.54 THz was detected using the Michelson interferometric setup. [ABSTRACT FROM AUTHOR] |
|
Copyright of Superconductor Science & Technology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |