Bibliographic Details
| Title: |
Envelope Tracking Fundamentals and Test Solutions. |
| Authors: |
FERGUSON, SEAN1, NELSON, HAYDN1 |
| Source: |
Microwave Journal. Jun2013, Vol. 56 Issue 6, p66-74. 6p. |
| Subjects: |
Engineers, Tracking & trailing, Electronic amplifiers, Instrument industry, RF Parts (Company) |
| Abstract: |
The article discusses the fundamentals of envelope tracking (ET) using data collected from RF PA to identify crucial ET parameters. It proposes and analyzes a PXI-based measurement setup that meets stringent requirements of ET test. The principle behind ET is operating the amplifier in compression as often as possible since both the point of peak efficiency and point of peak output power vary. It notes how ET proposes significant instrumentation challenges to PA designers and test engineers. |
| Database: |
Engineering Source |