View in EDS PDF Full Text

Envelope Tracking Fundamentals and Test Solutions.

Saved in:
Bibliographic Details
Title: Envelope Tracking Fundamentals and Test Solutions.
Authors: FERGUSON, SEAN1, NELSON, HAYDN1
Source: Microwave Journal. Jun2013, Vol. 56 Issue 6, p66-74. 6p.
Subjects: Engineers, Tracking & trailing, Electronic amplifiers, Instrument industry, RF Parts (Company)
Abstract: The article discusses the fundamentals of envelope tracking (ET) using data collected from RF PA to identify crucial ET parameters. It proposes and analyzes a PXI-based measurement setup that meets stringent requirements of ET test. The principle behind ET is operating the amplifier in compression as often as possible since both the point of peak efficiency and point of peak output power vary. It notes how ET proposes significant instrumentation challenges to PA designers and test engineers.
Database: Engineering Source
FullText Links:
  – Type: pdflink
Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 88315661
AccessLevel: 6
PubType: Periodical
PubTypeId: serialPeriodical
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Envelope Tracking Fundamentals and Test Solutions.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22FERGUSON%2C+SEAN%22">FERGUSON, SEAN</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22NELSON%2C+HAYDN%22">NELSON, HAYDN</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Microwave+Journal%22">Microwave Journal</searchLink>. Jun2013, Vol. 56 Issue 6, p66-74. 6p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Engineers%22">Engineers</searchLink><br /><searchLink fieldCode="DE" term="%22Tracking+%26+trailing%22">Tracking & trailing</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+amplifiers%22">Electronic amplifiers</searchLink><br /><searchLink fieldCode="DE" term="%22Instrument+industry%22">Instrument industry</searchLink><br /><searchLink fieldCode="DE" term="%22RF+Parts+%28Company%29%22">RF Parts (Company)</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The article discusses the fundamentals of envelope tracking (ET) using data collected from RF PA to identify crucial ET parameters. It proposes and analyzes a PXI-based measurement setup that meets stringent requirements of ET test. The principle behind ET is operating the amplifier in compression as often as possible since both the point of peak efficiency and point of peak output power vary. It notes how ET proposes significant instrumentation challenges to PA designers and test engineers.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=88315661
RecordInfo BibRecord:
  BibEntity:
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 66
    Subjects:
      – SubjectFull: Engineers
        Type: general
      – SubjectFull: Tracking & trailing
        Type: general
      – SubjectFull: Electronic amplifiers
        Type: general
      – SubjectFull: Instrument industry
        Type: general
      – SubjectFull: RF Parts (Company)
        Type: general
    Titles:
      – TitleFull: Envelope Tracking Fundamentals and Test Solutions.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: FERGUSON, SEAN
      – PersonEntity:
          Name:
            NameFull: NELSON, HAYDN
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2013
              Type: published
              Y: 2013
          Identifiers:
            – Type: issn-print
              Value: 01926225
          Numbering:
            – Type: volume
              Value: 56
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Microwave Journal
              Type: main
ResultId 1