APA (7th ed.) Citation

Li, D., Carette, M., Granier, A., Landesman, J., & Goullet, A. (2013). In situ spectroscopic ellipsometry study of TiO2 films deposited by plasma enhanced chemical vapour deposition. Applied Surface Science, 283, 234. https://doi.org/10.1016/j.apsusc.2013.06.091

Chicago Style (17th ed.) Citation

Li, D., M. Carette, A. Granier, J.P Landesman, and A. Goullet. "In Situ Spectroscopic Ellipsometry Study of TiO2 Films Deposited by Plasma Enhanced Chemical Vapour Deposition." Applied Surface Science 283 (2013): 234. https://doi.org/10.1016/j.apsusc.2013.06.091.

MLA (9th ed.) Citation

Li, D., et al. "In Situ Spectroscopic Ellipsometry Study of TiO2 Films Deposited by Plasma Enhanced Chemical Vapour Deposition." Applied Surface Science, vol. 283, 2013, p. 234, https://doi.org/10.1016/j.apsusc.2013.06.091.