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Analysis of microdischarges in asymmetric dielectric barrier discharges in argon.

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Title: Analysis of microdischarges in asymmetric dielectric barrier discharges in argon.
Authors: Becker, M. M.1 markus.becker@inp-greifswald.de, Hoder, T.1, Brandenburg, R.1, Loffhagen, D.1
Source: Journal of Physics D: Applied Physics. 2013, Vol. 46 Issue 35, p1-15. 15p.
Subjects: Argon, Atmospheric pressure, Ionization (Atomic physics), Chemical kinetics, Electric fields
Abstract: Theoretical and experimental studies of two different discharge modes in asymmetric dielectric barrier discharges in argon at atmospheric pressure have been performed. The first mode appears to be the well-known filamentary microdischarge with non-striated positive column whereas the second mode is characterized by discharge instabilities and the appearance of striations. Both experiment and model calculations predict a transition from the first mode to the second mode when the applied voltage amplitude is increased above approximately 2 kV. The reliability of the employed fluid model is confirmed by comparison of the current-voltage characteristics obtained by model calculations and measurements for different applied voltage amplitudes. The results of the model calculations point out that in the second discharge mode the ionization of excited argon atoms prevents the total recombination of charge carriers between two subsequent discharge events. This leads to the occurrence of the memory from one discharge to the following one, which plays an important role in mode transition. [ABSTRACT FROM AUTHOR]
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Database: Engineering Source
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Abstract:Theoretical and experimental studies of two different discharge modes in asymmetric dielectric barrier discharges in argon at atmospheric pressure have been performed. The first mode appears to be the well-known filamentary microdischarge with non-striated positive column whereas the second mode is characterized by discharge instabilities and the appearance of striations. Both experiment and model calculations predict a transition from the first mode to the second mode when the applied voltage amplitude is increased above approximately 2 kV. The reliability of the employed fluid model is confirmed by comparison of the current-voltage characteristics obtained by model calculations and measurements for different applied voltage amplitudes. The results of the model calculations point out that in the second discharge mode the ionization of excited argon atoms prevents the total recombination of charge carriers between two subsequent discharge events. This leads to the occurrence of the memory from one discharge to the following one, which plays an important role in mode transition. [ABSTRACT FROM AUTHOR]
ISSN:00223727
DOI:10.1088/0022-3727/46/35/355203