Bibliographic Details
| Title: |
X-ray Specular Reflection under Conditions of Extremely Asymmetric Noncoplanar Diffraction from a Bicrystal. |
| Authors: |
Bushuev, V. A., Oreshko, A. P. |
| Source: |
Crystallography Reports. Mar2003, Vol. 48 Issue 2, p180. 7p. |
| Subjects: |
Specular microscopy, Diffractive scattering, Liquid crystal films |
| Abstract: |
The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © 2003 MAIK “Nauka / Interperiodica”. [ABSTRACT FROM AUTHOR] |
|
Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Engineering Source |
