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X-ray Specular Reflection under Conditions of Extremely Asymmetric Noncoplanar Diffraction from a Bicrystal.

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Title: X-ray Specular Reflection under Conditions of Extremely Asymmetric Noncoplanar Diffraction from a Bicrystal.
Authors: Bushuev, V. A., Oreshko, A. P.
Source: Crystallography Reports. Mar2003, Vol. 48 Issue 2, p180. 7p.
Subjects: Specular microscopy, Diffractive scattering, Liquid crystal films
Abstract: The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © 2003 MAIK “Nauka / Interperiodica”. [ABSTRACT FROM AUTHOR]
Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  – Type: pdflink
Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 9468310
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: X-ray Specular Reflection under Conditions of Extremely Asymmetric Noncoplanar Diffraction from a Bicrystal.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Bushuev%2C+V%2E+A%2E%22">Bushuev, V. A.</searchLink><br /><searchLink fieldCode="AR" term="%22Oreshko%2C+A%2E+P%2E%22">Oreshko, A. P.</searchLink>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Crystallography+Reports%22">Crystallography Reports</searchLink>. Mar2003, Vol. 48 Issue 2, p180. 7p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Specular+microscopy%22">Specular microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Diffractive+scattering%22">Diffractive scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Liquid+crystal+films%22">Liquid crystal films</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The angular dependence of the intensities of X-ray specular reflection has been rigorously analyzed under conditions of noncoplanar grazing Bragg diffraction in a crystal coated with a crystalline film (bicrystal). It is shown that the anomalous angular dependence of the specular-reflection intensity is extremely sensitive to the thickness (from fractions of a nanometer up to several nanometers), deformation, and the amorphization degree of the crystalline films. The optimum conditions for recording intensities are attained at grazing angles equal to 1.5–4.0 of the critical angle of the total external reflection. © 2003 MAIK “Nauka / Interperiodica”. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1134/1.1564191
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 7
        StartPage: 180
    Subjects:
      – SubjectFull: Specular microscopy
        Type: general
      – SubjectFull: Diffractive scattering
        Type: general
      – SubjectFull: Liquid crystal films
        Type: general
    Titles:
      – TitleFull: X-ray Specular Reflection under Conditions of Extremely Asymmetric Noncoplanar Diffraction from a Bicrystal.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Bushuev, V. A.
      – PersonEntity:
          Name:
            NameFull: Oreshko, A. P.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: Mar2003
              Type: published
              Y: 2003
          Identifiers:
            – Type: issn-print
              Value: 10637745
          Numbering:
            – Type: volume
              Value: 48
            – Type: issue
              Value: 2
          Titles:
            – TitleFull: Crystallography Reports
              Type: main
ResultId 1