Bibliographic Details
| Title: |
Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers. |
| Authors: |
Insignares-Cuello, C.1 cinsignares@irec.cat, Izquierdo-Roca, V.1, López-García, J.1, Calvo-Barrio, L.2, Saucedo, E.1, Kretzschmar, S.3, Unold, T.3, Broussillou, C.4, Goislard de Monsabert, T.4, Bermudez, V.4, Pérez-Rodríguez, A.1,5 |
| Source: |
Solar Energy. May2014, Vol. 103, p89-95. 7p. |
| Subjects: |
Raman scattering, Photoluminescence, Electroplating, Copper compounds, Gallium |
| Abstract: |
Highlights: [•] Nondestructive chemical quantitative analysis of Cu(In,Ga)Se2 by photoluminescence. [•] Extension to nondestructive Ga depth profile assessment with confocal measurements. [•] Correlation with Raman scattering microcrystalline and phase assessment. [•] Demonstration of methodologies for monitoring of advanced CIGS PV technologies. [Copyright &y& Elsevier] |
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| Database: |
Engineering Source |
