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Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers.

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Title: Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se2 electrodeposited layers.
Authors: Insignares-Cuello, C.1 cinsignares@irec.cat, Izquierdo-Roca, V.1, López-García, J.1, Calvo-Barrio, L.2, Saucedo, E.1, Kretzschmar, S.3, Unold, T.3, Broussillou, C.4, Goislard de Monsabert, T.4, Bermudez, V.4, Pérez-Rodríguez, A.1,5
Source: Solar Energy. May2014, Vol. 103, p89-95. 7p.
Subjects: Raman scattering, Photoluminescence, Electroplating, Copper compounds, Gallium
Abstract: Highlights: [•] Nondestructive chemical quantitative analysis of Cu(In,Ga)Se2 by photoluminescence. [•] Extension to nondestructive Ga depth profile assessment with confocal measurements. [•] Correlation with Raman scattering microcrystalline and phase assessment. [•] Demonstration of methodologies for monitoring of advanced CIGS PV technologies. [Copyright &y& Elsevier]
Copyright of Solar Energy is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 95630397
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
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  Data: Combined Raman scattering/photoluminescence analysis of Cu(In,Ga)Se<subscript>2</subscript> electrodeposited layers.
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  Data: <searchLink fieldCode="JN" term="%22Solar+Energy%22">Solar Energy</searchLink>. May2014, Vol. 103, p89-95. 7p.
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  Data: <searchLink fieldCode="DE" term="%22Raman+scattering%22">Raman scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Photoluminescence%22">Photoluminescence</searchLink><br /><searchLink fieldCode="DE" term="%22Electroplating%22">Electroplating</searchLink><br /><searchLink fieldCode="DE" term="%22Copper+compounds%22">Copper compounds</searchLink><br /><searchLink fieldCode="DE" term="%22Gallium%22">Gallium</searchLink>
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  Data: Highlights: [•] Nondestructive chemical quantitative analysis of Cu(In,Ga)Se2 by photoluminescence. [•] Extension to nondestructive Ga depth profile assessment with confocal measurements. [•] Correlation with Raman scattering microcrystalline and phase assessment. [•] Demonstration of methodologies for monitoring of advanced CIGS PV technologies. [Copyright &y& Elsevier]
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  Data: <i>Copyright of Solar Energy is the property of Pergamon Press - An Imprint of Elsevier Science and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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              Text: May2014
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