Bibliographic Details
| Title: |
Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications. |
| Authors: |
Adamska, A M1 am.adamska@bristol.ac.uk, Springell, R1, Warren, A D1, Picco, L1, Payton, O1, Scott, T B1 |
| Source: |
Journal of Physics D: Applied Physics. 8/6/2014, Vol. 47 Issue 31, p1-1. 1p. |
| Subjects: |
Thin films, Uranium alloys, Zirconium alloys, Sapphires, Crystal structure |
| Abstract: |
Polycrystalline and epitaxial U–Zr thin films have been grown on glass and single-crystal sapphire substrates using ultra-high vacuum magnetron sputtering at high temperatures (T = 800 °C). Mixed α- and γ-U phases were detected for polycrystalline U–Zr alloy thin films with the prevailing crystal structure controlled by composition. Epitaxial U–Zr thin film samples were determined to form bi-layered structures of single-crystal γ-U and α-U phases or γ-U, δ UZr2 and α-U phases depending on the concentration of the alloying element. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |
