Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications.
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| Title: | Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications. |
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| Authors: | Adamska, A M1 am.adamska@bristol.ac.uk, Springell, R1, Warren, A D1, Picco, L1, Payton, O1, Scott, T B1 |
| Source: | Journal of Physics D: Applied Physics. 8/6/2014, Vol. 47 Issue 31, p1-1. 1p. |
| Subjects: | Thin films, Uranium alloys, Zirconium alloys, Sapphires, Crystal structure |
| Abstract: | Polycrystalline and epitaxial U–Zr thin films have been grown on glass and single-crystal sapphire substrates using ultra-high vacuum magnetron sputtering at high temperatures (T = 800 °C). Mixed α- and γ-U phases were detected for polycrystalline U–Zr alloy thin films with the prevailing crystal structure controlled by composition. Epitaxial U–Zr thin film samples were determined to form bi-layered structures of single-crystal γ-U and α-U phases or γ-U, δ UZr2 and α-U phases depending on the concentration of the alloying element. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Physics D: Applied Physics is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 97048055 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Adamska%2C+A+M%22">Adamska, A M</searchLink><relatesTo>1</relatesTo><i> am.adamska@bristol.ac.uk</i><br /><searchLink fieldCode="AR" term="%22Springell%2C+R%22">Springell, R</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Warren%2C+A+D%22">Warren, A D</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Picco%2C+L%22">Picco, L</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Payton%2C+O%22">Payton, O</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Scott%2C+T+B%22">Scott, T B</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Physics+D%3A+Applied+Physics%22">Journal of Physics D: Applied Physics</searchLink>. 8/6/2014, Vol. 47 Issue 31, p1-1. 1p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Uranium+alloys%22">Uranium alloys</searchLink><br /><searchLink fieldCode="DE" term="%22Zirconium+alloys%22">Zirconium alloys</searchLink><br /><searchLink fieldCode="DE" term="%22Sapphires%22">Sapphires</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+structure%22">Crystal structure</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Polycrystalline and epitaxial U–Zr thin films have been grown on glass and single-crystal sapphire substrates using ultra-high vacuum magnetron sputtering at high temperatures (T = 800 °C). Mixed α- and γ-U phases were detected for polycrystalline U–Zr alloy thin films with the prevailing crystal structure controlled by composition. Epitaxial U–Zr thin film samples were determined to form bi-layered structures of single-crystal γ-U and α-U phases or γ-U, δ UZr2 and α-U phases depending on the concentration of the alloying element. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Physics D: Applied Physics is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1088/0022-3727/47/31/315301 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: 1 Subjects: – SubjectFull: Thin films Type: general – SubjectFull: Uranium alloys Type: general – SubjectFull: Zirconium alloys Type: general – SubjectFull: Sapphires Type: general – SubjectFull: Crystal structure Type: general Titles: – TitleFull: Growth and characterization of uranium–zirconium alloy thin films for nuclear industry applications. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Adamska, A M – PersonEntity: Name: NameFull: Springell, R – PersonEntity: Name: NameFull: Warren, A D – PersonEntity: Name: NameFull: Picco, L – PersonEntity: Name: NameFull: Payton, O – PersonEntity: Name: NameFull: Scott, T B IsPartOfRelationships: – BibEntity: Dates: – D: 06 M: 08 Text: 8/6/2014 Type: published Y: 2014 Identifiers: – Type: issn-print Value: 00223727 Numbering: – Type: volume Value: 47 – Type: issue Value: 31 Titles: – TitleFull: Journal of Physics D: Applied Physics Type: main |
| ResultId | 1 |
