Bibliographic Details
| Title: |
Longitudinal relationships between academic stress and executive function in Chinese high school students: A cross-lagged panel network analysis. |
| Authors: |
Ma, Chao1,2 (AUTHOR), Wang, Yanyun1,2 (AUTHOR), Fu, Junjun1,2 (AUTHOR), Zhao, Xin1,2 (AUTHOR) psyzhaoxin@nwnu.edu.cn |
| Source: |
Contemporary Educational Psychology. Dec2025, Vol. 83, pN.PAG-N.PAG. 1p. |
| Subject Terms: |
*Teacher burnout, *Chinese-speaking students, *Short-term memory, *Overpressure (Education), Psychological stress, Executive function, Panel analysis |
| Abstract: |
[Display omitted] • The study explores the longitudinal relationship between various dimensions of academic stress and the subcomponents of executive function in Chinese high school students using cross-lagged panel network analysis. • Self-imposed stress was identified as having the strongest positive predictive effect on working memory updating and working memory span. • Teacher stress was found to have the most substantial negative predictive effect on both working memory updating and response inhibition. • The study reveals that self-imposed stress mediates the relationship between parental stress and working memory components, providing insights into stress transmission pathways. • Self-imposed stress and teacher stress emerged as key "high bridge centrality nodes" in the psychological network, suggesting crucial intervention points for mitigating the negative effects of academic stress on students. Academic stress, as one of the most common potential risk factors experienced by Chinese high school students, has a significant impact on the development of executive function. However, previous studies exploring the relationship between academic stress and executive function have produced inconsistent findings, either neglecting the multidimensionality of academic stress or overlooking the separability of executive function. Therefore, this study employed a cross-lagged panel network analysis to investigate the longitudinal relationship between various types of academic stress and the subcomponents of executive function among 620 Chinese high school students. The findings revealed that self-imposed stress had the strongest positive predictive effect on working memory updating and working memory span. In contrast, teacher stress exerted the most crucial negative predictive effect on working memory updating and response inhibition, while social stress showed a lesser negative predictive effect on response inhibition. Notably, self-imposed stress mediated the relationship between parental stress and both working memory updating and working memory span. Furthermore, self-imposed stress and teacher stress were identified as the most crucial "high bridge centrality nodes" within the network, indicating key intervention targets. The study's conclusions offer valuable insights for educators in formulating effective strategies to help high school students manage academic stress. [ABSTRACT FROM AUTHOR] |
|
Copyright of Contemporary Educational Psychology is the property of Academic Press Inc. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Education Research Complete |