View in EDS HTML Full Text PDF Full Text

Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.

Saved in:
Bibliographic Details
Title: Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.
Authors: Elash, Christopher J.1 (AUTHOR) Li.Chen@usask.ca, Pour-Momen, Peiman1 (AUTHOR), Shi, Shuting1 (AUTHOR), Belev, George2 (AUTHOR), Sammynaiken, R.2 (AUTHOR), Chen, Li1 (AUTHOR) Li.Chen@usask.ca
Source: Canadian Journal of Chemistry. 2025, Vol. 103 Issue 6, p270-279. 10p.
Database: Environment Complete
Full text is not displayed to guests.
Description
ISSN:00084042
DOI:10.1139/cjc-2024-0103