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Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.

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Title: Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.
Authors: Elash, Christopher J.1 (AUTHOR) Li.Chen@usask.ca, Pour-Momen, Peiman1 (AUTHOR), Shi, Shuting1 (AUTHOR), Belev, George2 (AUTHOR), Sammynaiken, R.2 (AUTHOR), Chen, Li1 (AUTHOR) Li.Chen@usask.ca
Source: Canadian Journal of Chemistry. 2025, Vol. 103 Issue 6, p270-279. 10p.
Database: Environment Complete
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DbLabel: Environment Complete
An: 185994146
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Elash%2C+Christopher+J%2E%22">Elash, Christopher J.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> Li.Chen@usask.ca</i><br /><searchLink fieldCode="AR" term="%22Pour-Momen%2C+Peiman%22">Pour-Momen, Peiman</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Shi%2C+Shuting%22">Shi, Shuting</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Belev%2C+George%22">Belev, George</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sammynaiken%2C+R%2E%22">Sammynaiken, R.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Li%22">Chen, Li</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> Li.Chen@usask.ca</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Canadian+Journal+of+Chemistry%22">Canadian Journal of Chemistry</searchLink>. 2025, Vol. 103 Issue 6, p270-279. 10p.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=eih&AN=185994146
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1139/cjc-2024-0103
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 270
    Titles:
      – TitleFull: Design and testing of a pulsed laser system for single event effects analysis on semiconductor devices.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Elash, Christopher J.
      – PersonEntity:
          Name:
            NameFull: Pour-Momen, Peiman
      – PersonEntity:
          Name:
            NameFull: Shi, Shuting
      – PersonEntity:
          Name:
            NameFull: Belev, George
      – PersonEntity:
          Name:
            NameFull: Sammynaiken, R.
      – PersonEntity:
          Name:
            NameFull: Chen, Li
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: 2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 00084042
          Numbering:
            – Type: volume
              Value: 103
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: Canadian Journal of Chemistry
              Type: main
ResultId 1